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Title: Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA

Authors:
 [1];  [1]; ORCiD logo [1]; ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623-1299, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1597538
Grant/Contract Number:  
NA0003856
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 91 Journal Issue: 2; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Theobald, W., Sorce, C., Donaldson, W. R., Epstein, R., Keck, R. L., Kellogg, C., Kessler, T. J., Kwiatkowski, J., Marshall, F. J., Sampat, S., Seka, W., Shah, R. C., Shvydky, A., Stoeckl, C., Waxer, L. J., and Regan, S. P. Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA. United States: N. p., 2020. Web. doi:10.1063/1.5120708.
Theobald, W., Sorce, C., Donaldson, W. R., Epstein, R., Keck, R. L., Kellogg, C., Kessler, T. J., Kwiatkowski, J., Marshall, F. J., Sampat, S., Seka, W., Shah, R. C., Shvydky, A., Stoeckl, C., Waxer, L. J., & Regan, S. P. Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA. United States. doi:10.1063/1.5120708.
Theobald, W., Sorce, C., Donaldson, W. R., Epstein, R., Keck, R. L., Kellogg, C., Kessler, T. J., Kwiatkowski, J., Marshall, F. J., Sampat, S., Seka, W., Shah, R. C., Shvydky, A., Stoeckl, C., Waxer, L. J., and Regan, S. P. Sat . "Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA". United States. doi:10.1063/1.5120708.
@article{osti_1597538,
title = {Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA},
author = {Theobald, W. and Sorce, C. and Donaldson, W. R. and Epstein, R. and Keck, R. L. and Kellogg, C. and Kessler, T. J. and Kwiatkowski, J. and Marshall, F. J. and Sampat, S. and Seka, W. and Shah, R. C. and Shvydky, A. and Stoeckl, C. and Waxer, L. J. and Regan, S. P.},
abstractNote = {},
doi = {10.1063/1.5120708},
journal = {Review of Scientific Instruments},
number = 2,
volume = 91,
place = {United States},
year = {2020},
month = {2}
}

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