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Title: Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry

Authors:
ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]
  1. Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1597135
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Name: Journal of Applied Physics Journal Volume: 127 Journal Issue: 5; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

McKay, M. A., Li, J., Lin, J. Y., and Jiang, H. X. Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry. United States: N. p., 2020. Web. doi:10.1063/1.5134908.
McKay, M. A., Li, J., Lin, J. Y., & Jiang, H. X. Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry. United States. doi:10.1063/1.5134908.
McKay, M. A., Li, J., Lin, J. Y., and Jiang, H. X. Fri . "Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry". United States. doi:10.1063/1.5134908.
@article{osti_1597135,
title = {Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry},
author = {McKay, M. A. and Li, J. and Lin, J. Y. and Jiang, H. X.},
abstractNote = {},
doi = {10.1063/1.5134908},
journal = {Journal of Applied Physics},
number = 5,
volume = 127,
place = {United States},
year = {2020},
month = {2}
}

Journal Article:
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