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Title: Experimental Test of Strong Pinning and Creep in Current-Voltage Characteristics of Type-II Superconductors

Abstract

Pinning and creep determine the current-voltage characteristics of a type-II superconductor and thereby its potential for technological applications. The recent development of strong pinning theory provides us with a tool to assess a superconductor's electric properties in a quantitative way. Motivated by the observation of typical excess-current characteristics and field scaling of critical currents, here we analyze current-voltage characteristics measured on 2H-NbSe 2 and α-MoGe type-II superconductors within the setting provided by strong pinning theory. The experimentally observed shift and rounding of the voltage onset is consistent with the predictions of strong pinning in the presence of thermal fluctuations. We find the underlying parameters determining pinning and creep and discuss their consistency.

Authors:
 [1];  [2];  [3];  [4]; ORCiD logo [3];  [1];  [1]
  1. Federal Inst. of Technology, Zurich (Switzerland). Inst. for Theoretical Physics
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Tata Inst. of Fundamental Research, Mumbai (India)
  4. Rutgers Univ., Piscataway, NJ (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division; Swiss National Science Foundation (SNSF); National Science Foundation (NSF)
OSTI Identifier:
1596683
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review, B: Condensed Matter
Additional Journal Information:
Journal Volume: 100; Journal Issue: 22; Journal ID: ISSN 0163-1829
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Buchacek, M., Xiao, Z. L., Dutta, S., Andrei, E. Y., Raychaudhuri, P., Geshkenbein, V. B., and Blatter, G. Experimental Test of Strong Pinning and Creep in Current-Voltage Characteristics of Type-II Superconductors. United States: N. p., 2019. Web. doi:10.1103/PhysRevB.100.224502.
Buchacek, M., Xiao, Z. L., Dutta, S., Andrei, E. Y., Raychaudhuri, P., Geshkenbein, V. B., & Blatter, G. Experimental Test of Strong Pinning and Creep in Current-Voltage Characteristics of Type-II Superconductors. United States. doi:10.1103/PhysRevB.100.224502.
Buchacek, M., Xiao, Z. L., Dutta, S., Andrei, E. Y., Raychaudhuri, P., Geshkenbein, V. B., and Blatter, G. Wed . "Experimental Test of Strong Pinning and Creep in Current-Voltage Characteristics of Type-II Superconductors". United States. doi:10.1103/PhysRevB.100.224502.
@article{osti_1596683,
title = {Experimental Test of Strong Pinning and Creep in Current-Voltage Characteristics of Type-II Superconductors},
author = {Buchacek, M. and Xiao, Z. L. and Dutta, S. and Andrei, E. Y. and Raychaudhuri, P. and Geshkenbein, V. B. and Blatter, G.},
abstractNote = {Pinning and creep determine the current-voltage characteristics of a type-II superconductor and thereby its potential for technological applications. The recent development of strong pinning theory provides us with a tool to assess a superconductor's electric properties in a quantitative way. Motivated by the observation of typical excess-current characteristics and field scaling of critical currents, here we analyze current-voltage characteristics measured on 2H-NbSe2 and α-MoGe type-II superconductors within the setting provided by strong pinning theory. The experimentally observed shift and rounding of the voltage onset is consistent with the predictions of strong pinning in the presence of thermal fluctuations. We find the underlying parameters determining pinning and creep and discuss their consistency.},
doi = {10.1103/PhysRevB.100.224502},
journal = {Physical Review, B: Condensed Matter},
number = 22,
volume = 100,
place = {United States},
year = {2019},
month = {12}
}

Journal Article:
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