Structural Evolution During Perovskite Crystal Formation and Degradation: In Situ and Operando X–Ray Diffraction Studies
Abstract
This review provides an update on the progress in understanding formation and degradation mechanisms in halide perovskites for photovoltaic applications, as supported by in situ and operando X–ray scattering techniques. The value of these real–time analyses is particularly high for gaining insights into the structural evolution during crystal formation and decomposition upon exposure to external stress factors. This type of analysis reveals the pathways between starting and end points of a process rather than being limited to comparing states before and after the process. Special attention is put on the successful efforts toward upscaling including deposition techniques that are compatible to roll–to–roll processing. These processes are realized using fast annealing procedures. The development of these processes strongly benefited from in situ studies exploring the direct transition from precursor to perovskite without going through observable crystalline intermediate phases. A particular focus of this review is the benefit of using in situ and operando X–ray scattering techniques to better understand and ultimately improve device stability. In conclusion, the difference between structural stability of thin films and structural stability under device operation is highlighted, convincingly demonstrating the indispensability of operando studies.
- Publication Date:
- Research Org.:
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- OSTI Identifier:
- 1596308
- Alternate Identifier(s):
- OSTI ID: 1575780
- Grant/Contract Number:
- AC02-76SF00515; AC36‐08‐GO28308
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Advanced Energy Materials
- Additional Journal Information:
- Journal Volume: 10; Journal Issue: 26; Journal ID: ISSN 1614-6832
- Publisher:
- Wiley
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; halide perovskites; in situ; X‐ray scattering
Citation Formats
Mundt, Laura E., and Schelhas, Laura T. Structural Evolution During Perovskite Crystal Formation and Degradation: In Situ and Operando X–Ray Diffraction Studies. United States: N. p., 2019.
Web. doi:10.1002/aenm.201903074.
Mundt, Laura E., & Schelhas, Laura T. Structural Evolution During Perovskite Crystal Formation and Degradation: In Situ and Operando X–Ray Diffraction Studies. United States. https://doi.org/10.1002/aenm.201903074
Mundt, Laura E., and Schelhas, Laura T. Mon .
"Structural Evolution During Perovskite Crystal Formation and Degradation: In Situ and Operando X–Ray Diffraction Studies". United States. https://doi.org/10.1002/aenm.201903074. https://www.osti.gov/servlets/purl/1596308.
@article{osti_1596308,
title = {Structural Evolution During Perovskite Crystal Formation and Degradation: In Situ and Operando X–Ray Diffraction Studies},
author = {Mundt, Laura E. and Schelhas, Laura T.},
abstractNote = {This review provides an update on the progress in understanding formation and degradation mechanisms in halide perovskites for photovoltaic applications, as supported by in situ and operando X–ray scattering techniques. The value of these real–time analyses is particularly high for gaining insights into the structural evolution during crystal formation and decomposition upon exposure to external stress factors. This type of analysis reveals the pathways between starting and end points of a process rather than being limited to comparing states before and after the process. Special attention is put on the successful efforts toward upscaling including deposition techniques that are compatible to roll–to–roll processing. These processes are realized using fast annealing procedures. The development of these processes strongly benefited from in situ studies exploring the direct transition from precursor to perovskite without going through observable crystalline intermediate phases. A particular focus of this review is the benefit of using in situ and operando X–ray scattering techniques to better understand and ultimately improve device stability. In conclusion, the difference between structural stability of thin films and structural stability under device operation is highlighted, convincingly demonstrating the indispensability of operando studies.},
doi = {10.1002/aenm.201903074},
journal = {Advanced Energy Materials},
number = 26,
volume = 10,
place = {United States},
year = {2019},
month = {11}
}
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