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Title: Influence of Resonances on the Noise Performance of SQUID Susceptometers

Journal Article · · Sensors
DOI: https://doi.org/10.3390/s20010204 · OSTI ID:1595311
ORCiD logo [1];  [2];  [3]
  1. Stanford Univ., CA (United States); California Institute of Technology (CalTech), Pasadena, CA (United States)
  2. Stanford Univ., CA (United States). Geballe Lab. for Advanced Materials
  3. Stanford Univ., CA (United States); Stanford Univ., CA (United States). Geballe Lab. for Advanced Materials; SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Institute for Materials and Energy Science (SIMES)

Scanning Superconducting Quantum Interference Device (SQUID) Susceptometry simultaneously images the local magnetic fields and susceptibilities above a sample with sub-micron spatial resolution. Further development of this technique requires a thorough understanding of the current, voltage, and flux ( I V Φ ) characteristics of scanning SQUID susceptometers. These sensors often have striking anomalies in their current–voltage characteristics, which we believe to be due to electromagnetic resonances. The effect of these resonances on the performance of these SQUIDs is unknown. To explore the origin and impact of the resonances, we develop a model that qualitatively reproduces the experimentally-determined I V Φ characteristics of our scanning SQUID susceptometers. We use this model to calculate the noise characteristics of SQUIDs of different designs. We find that the calculated ultimate flux noise is better in susceptometers with damping resistors that diminish the resonances than in susceptometers without damping resistors. Such calculations will enable the optimization of the signal-to-noise characteristics of scanning SQUID susceptometers.

Research Organization:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
AC02-76SF00515
OSTI ID:
1595311
Journal Information:
Sensors, Vol. 20, Issue 1; ISSN 1424-8220
Publisher:
MDPI AGCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 5 works
Citation information provided by
Web of Science

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