Exploring the accuracy limits of lattice strain quantification with synthetic diffraction data

Journal Article · 30 May 2018 · Scripta Materialia

DOI: https://doi.org/10.1016/j.scriptamat.2018.05.028 · OSTI ID:1595229

Zhang, C. ^[1]; Bieler, T. R. ^[2]; Eisenlohr, P. ^[2]

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1. Michigan State Univ., East Lansing, MI (United States); michigan state university
2. Michigan State Univ., East Lansing, MI (United States)

From a collection of scattering vectors obtained by synchrotron X-ray diffraction, the lattice strain can be spatially quantified. In this paper, we explore the inherent accuracy limits by comparing a least-squares regression and an optimization method applied to synthetic diffraction data excluding any measurement uncertainties potentially present in real experiments. The optimization method in combination with a novel fitness function can identify the deviatoric/full lattice deformation gradient with accuracy better than 10^-9. Lastly, the least-squares regression is much less accurate unless all scattering vector lengths are known, in which case the exact lattice deformation gradient can be recovered.

• Research Organization: Michigan State Univ., East Lansing, MI (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
• Grant/Contract Number: SC0001525
• OSTI ID: 1595229
• Journal Information: Scripta Materialia, Journal Name: Scripta Materialia Journal Issue: C Vol. 154; ISSN 1359-6462
• Publisher: ElsevierCopyright Statement
• Country of Publication: United States
• Language: English