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Title: Imaging Coherent Structural Dynamics with Ultrafast Electron Microscopy

Abstract

Abstract not provided.

Authors:
 [1];  [1];  [1];  [1];  [1]
  1. Univ. of Minnesota, Minneapolis, MN (United States
Publication Date:
Research Org.:
Univ. of Minnesota, Minneapolis, MN (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Science Foundation (NSF)
OSTI Identifier:
1595048
Grant/Contract Number:  
[SC0018204; DMR-1420013; DGE-1348264]
Resource Type:
Accepted Manuscript
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
[ Journal Volume: 24; Journal Issue: S1]; Journal ID: ISSN 1431-9276
Publisher:
Microscopy Society of America (MSA)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Flannigan, David J., Cremons, Daniel R., Du, Daniel X., McKenna, Alyssa J., and Plemmons, Dayne A. Imaging Coherent Structural Dynamics with Ultrafast Electron Microscopy. United States: N. p., 2018. Web. doi:10.1017/S1431927618009674.
Flannigan, David J., Cremons, Daniel R., Du, Daniel X., McKenna, Alyssa J., & Plemmons, Dayne A. Imaging Coherent Structural Dynamics with Ultrafast Electron Microscopy. United States. doi:10.1017/S1431927618009674.
Flannigan, David J., Cremons, Daniel R., Du, Daniel X., McKenna, Alyssa J., and Plemmons, Dayne A. Wed . "Imaging Coherent Structural Dynamics with Ultrafast Electron Microscopy". United States. doi:10.1017/S1431927618009674. https://www.osti.gov/servlets/purl/1595048.
@article{osti_1595048,
title = {Imaging Coherent Structural Dynamics with Ultrafast Electron Microscopy},
author = {Flannigan, David J. and Cremons, Daniel R. and Du, Daniel X. and McKenna, Alyssa J. and Plemmons, Dayne A.},
abstractNote = {Abstract not provided.},
doi = {10.1017/S1431927618009674},
journal = {Microscopy and Microanalysis},
number = [S1],
volume = [24],
place = {United States},
year = {2018},
month = {8}
}

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Works referenced in this record:

Probing Structural and Electronic Dynamics with Ultrafast Electron Microscopy
journal, April 2015


4D Electron Microscopy: Principles and Applications
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  • Flannigan, David J.; Zewail, Ahmed H.
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Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes
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Defect-mediated phonon dynamics in TaS 2 and WSe 2
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Visualization of Atomic-Scale Motions in Materials via Femtosecond X-Ray Scattering Techniques
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Picosecond phase-velocity dispersion of hypersonic phonons imaged with ultrafast electron microscopy
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Femtosecond electron imaging of defect-modulated phonon dynamics
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  • Cremons, Daniel R.; Plemmons, Dayne A.; Flannigan, David J.
  • Nature Communications, Vol. 7, Issue 1
  • DOI: 10.1038/ncomms11230

Spatiotemporal Evolution of Coherent Elastic Strain Waves in a Single MoS 2 Flake
journal, May 2017