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Title: Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces

Abstract

The properties of artificially grown thin films are strongly affected by surface processes during growth. We demonstrate that the use of coherent X-rays provides an approach to better understand such processes and fluctuations far from equilibrium. In these experiments, vacuum deposition of C60 on a graphene-coated surface is investigated with X-ray Photon Correlation Spectroscopy in surface-sensitive conditions. Step-flow is observed through measurement of the step-edge velocity in the late stages of growth after crystalline mounds have formed. We show that the step-edge velocity on the growth surface is coupled to the terrace length, and that there is a variation in the velocity from larger step spacing at the center of crystalline mounds to closely-spaced, more slowly propagating steps at their edges. The results extend theories of surface growth during steady-state dynamics, since the behavior is consistent with surface evolution driven by processes spanning multiple length and time scales, including surface diffusion, the motion of fluctuating step-edges, and attachment at step edges with significant step-edge barriers.

Authors:
ORCiD logo [1];  [1]; ORCiD logo [2];  [1];  [1];  [3];  [3];  [3];  [2]
  1. Univ. of Vermont, Burlington, VT (United States)
  2. Boston Univ., MA (United States)
  3. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Publication Date:
Research Org.:
Univ. of Vermont, Burlington, VT (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division; National Science Foundation (NSF)
OSTI Identifier:
1594847
Grant/Contract Number:  
SC0017802; DMR-1709380; SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Nature Communications
Additional Journal Information:
Journal Volume: 10; Journal Issue: 1; Related Information: https://static-content.springer.com/esm/art%3A10.1038%2Fs41467-019-10629-8/MediaObjects/41467_2019_10629_MOESM1_ESM.pdf; Journal ID: ISSN 2041-1723
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Nanoscale materials; Carbon nanotubes and fullerenes; X-rays; Surfaces, interfaces and thin films; coherent x-ray scattering

Citation Formats

Headrick, Randall L., Ulbrandt, Jeffrey G., Myint, Peco, Wan, Jing, Li, Yang, Fluerasu, Andrei, Zhang, Yugang, Wiegart, Lutz, and Ludwig, Karl F. Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces. United States: N. p., 2019. Web. doi:10.1038/s41467-019-10629-8.
Headrick, Randall L., Ulbrandt, Jeffrey G., Myint, Peco, Wan, Jing, Li, Yang, Fluerasu, Andrei, Zhang, Yugang, Wiegart, Lutz, & Ludwig, Karl F. Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces. United States. doi:10.1038/s41467-019-10629-8.
Headrick, Randall L., Ulbrandt, Jeffrey G., Myint, Peco, Wan, Jing, Li, Yang, Fluerasu, Andrei, Zhang, Yugang, Wiegart, Lutz, and Ludwig, Karl F. Fri . "Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces". United States. doi:10.1038/s41467-019-10629-8. https://www.osti.gov/servlets/purl/1594847.
@article{osti_1594847,
title = {Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces},
author = {Headrick, Randall L. and Ulbrandt, Jeffrey G. and Myint, Peco and Wan, Jing and Li, Yang and Fluerasu, Andrei and Zhang, Yugang and Wiegart, Lutz and Ludwig, Karl F.},
abstractNote = {The properties of artificially grown thin films are strongly affected by surface processes during growth. We demonstrate that the use of coherent X-rays provides an approach to better understand such processes and fluctuations far from equilibrium. In these experiments, vacuum deposition of C60 on a graphene-coated surface is investigated with X-ray Photon Correlation Spectroscopy in surface-sensitive conditions. Step-flow is observed through measurement of the step-edge velocity in the late stages of growth after crystalline mounds have formed. We show that the step-edge velocity on the growth surface is coupled to the terrace length, and that there is a variation in the velocity from larger step spacing at the center of crystalline mounds to closely-spaced, more slowly propagating steps at their edges. The results extend theories of surface growth during steady-state dynamics, since the behavior is consistent with surface evolution driven by processes spanning multiple length and time scales, including surface diffusion, the motion of fluctuating step-edges, and attachment at step edges with significant step-edge barriers.},
doi = {10.1038/s41467-019-10629-8},
journal = {Nature Communications},
number = 1,
volume = 10,
place = {United States},
year = {2019},
month = {6}
}

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