Measurement of the branching ratio of ${\overline{B}}^0\to D^{*+}{\tau }^{-}{\overline{\nu }}_{\tau }$ relative to ${\overline{B}}^0\to D^{*+}{\ell }^{-}{\overline{\nu }}_{\ell }$ decays with a semileptonic tagging method

Journal Article · 27 October 2016 · Physical Review D

DOI: https://doi.org/10.1103/PhysRevD.94.072007 · OSTI ID:1594373

Sato, Y.; Iijima, T.; Adamczyk, K.; Aihara, H.; Asner, D. M.; Atmacan, H.; Aushev, T.; Ayad, R.; Aziz, T.; Babu, V.; Badhrees, I.; Bakich, A. M.; Bansal, V.; Behera, P.; Bhardwaj, V.; Bhuyan, B.; Biswal, J.; Bonvicini, G.; Bozek, A.; Bračko, M. ; Červenkov, D.; Chang, P.; Chekelian, V.; Chen, A.; Cheon, B. G.; Chilikin, K.; Chistov, R.; Cho, K.; Chobanova, V.; Choi, Y.; Cinabro, D.; Danilov, M.; Dash, N.; Di Carlo, S.; Doležal, Z.; Dutta, D.; Eidelman, S.; Epifanov, D.; Farhat, H.; Fast, J. E.; Ferber, T.; Fulsom, B. G.; Gaur, V.; Gabyshev, N.; Garmash, A.; Goldenzweig, P.; Golob, B.; Greenwald, D.; Hara, K.; Hara, T.; Hasenbusch, J.; Hayasaka, K.; Hayashii, H.; Hirose, S.; Horiguchi, T.; Hou, W. -S.; Inami, K.; Ishikawa, A.; Itoh, R.; Iwasaki, Y.; Jaegle, I.; Jeon, H. B.; Joffe, D.; Julius, T.; Kang, K. H.; Kato, Y.; Katrenko, P.; Kawasaki, T.; Kim, D. Y.; Kim, J. B.; Kim, K. T.; Kim, M. J.; Kim, S. H.; Kim, Y. J.; Kinoshita, K.; Kodyš, P.; Korpar, S.; Kotchetkov, D.; Krokovny, P.; Kuhr, T.; Kumar, R.; Kwon, Y. -J.; Lange, J. S.; Li, C. H.; Li, L.; Li, Y.; Li Gioi, L.; Libby, J.; Liventsev, D.; Luo, T.; Masuda, M.; Matsuda, T.; Matvienko, D.; Miyabayashi, K.; Miyata, H.; Mizuk, R.; Mohanty, G. B.; Moll, A.; Moon, H. K.; Nakamura, K. R.; Nakano, E.; Nakao, M.; Nanut, T.; Nath, K. J.; Natkaniec, Z.; Nayak, M.; Negishi, K.; Nisar, N. K.; Nishida, S.; Ogawa, S.; Okuno, S.; Olsen, S. L.; Onuki, Y.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Park, C. -S.; Paul, S.; Pedlar, T. K.; Pesántez, L.; Pestotnik, R.; Petrič, M.; Piilonen, L. E.; Purohit, M. V.; Rauch, J.; Rostomyan, A.; Rozanska, M.; Sakai, Y.; Sandilya, S.; Santelj, L.; Savinov, V.; Schlüter, T.; Schneider, O.; Schnell, G.; Schwanda, C.; Schwartz, A. J.; Seino, Y.; Senyo, K.; Seon, O.; Sevior, M. E.; Shebalin, V.; Shen, C. P.; Shibata, T. -A.; Shiu, J. -G.; Shwartz, B.; Simon, F.; Solovieva, E.; Stanič, S.; Starič, M.; Strube, J. F.; Sumiyoshi, T.; Takizawa, M.; Tamponi, U.; Tenchini, F.; Trabelsi, K.; Uchida, M.; Uno, S.; Urquijo, P.; Ushiroda, Y.; Usov, Y.; Van Hulse, C.; Varner, G.; Vinokurova, A.; Vorobyev, V.; Wang, C. H.; Wang, M. -Z.; Wang, P.; Watanabe, Y.; Williams, K. M.; Won, E.; Yamamoto, H.; Yamaoka, J.; Yamashita, Y.; Yelton, J.; Yook, Y.; Yuan, C. Z.; Yusa, Y.; Zhang, Z. P.; Zhilich, V.; Zhukova, V.; Zhulanov, V.; Zupanc, A.

Here, we report a measurement of the ratio $\mathcal{R}\left(D^{*}\right)=\mathcal{B}({\overline{B}}^0\to D^{*+}{\tau }^{-}{\overline{\nu }}_{\tau })/\mathcal{B}({\overline{B}}^0\to D^{*+}{\ell }^{-}{\overline{\nu }}_{\ell })$, where $\ell$ denotes an electron or a muon. The results are based on a data sample containing $772\times 10^{6}B\overline{B}$ pairs recorded at the $\mathrm{{\rm Y}}\left(4S\right)$ resonance with the Belle detector at the KEKB $e^{+}{e}^{-}$ collider. We select a sample of $B^0{\overline{B}}^0$ pairs by reconstructing both $B$ mesons in semileptonic decays to $D^{*\mp }{\ell }^{\pm }$. We measure $\mathcal{R}\left(D^{*}\right)=0.302\pm 0.030\left(\text{stat}\right)\pm 0.011\left(\text{syst}\right)$, which is within $1.6\sigma$ of the Standard Model theoretical expectation, where the standard deviation $\sigma$ includes systematic uncertainties. We use this measurement to constrain several scenarios of new physics in a model-independent technique.

• Research Organization: Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States); Univ. of Hawaii, Honolulu, HI (United States)
• Sponsoring Organization: USDOE Office of Science (SC), High Energy Physics (HEP); National Science Foundation (NSF)
• Contributing Organization: Belle Collaboration
• Grant/Contract Number: SC0009973; SC0010504
• OSTI ID: 1594373
• Alternate ID(s): OSTI ID: 1330289
• Journal Information: Physical Review D, Vol. 94, Issue 7; ISSN 2470-0010
• Publisher: American Physical Society (APS)Copyright Statement
• Country of Publication: United States
• Language: English