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Title: Analytical Platform To Characterize Dopant Solution Concentrations, Charge Carrier Densities in Films and Interfaces, and Physical Diffusion in Polymers Utilizing Remote Field-Effect Transistors

Abstract

Characterizing doping effects in a conductive polymer and physical diffusion in a passive polymer were performed using a remote-gate field-effect transistor (RG FET) detection system that was able to measure the electrical potential perturbation of a polymer film coupled to the gate of a silicon FET. Poly(3-hexylthiophene) (P3HT) film doped using various concentrations of 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F4TCNQ) solutions imposed additional positive potentials on the P3HT RG, resulting in a lower threshold voltage ($$V_{th}$$) on the n-channel silicon FET. Changes in $$V_{th}$$ were related to the induced hole concentrations and hole mobility in P3HT films by using our $$V_{th}$$ shifting model for the RG FET. We discovered that the electron-donating P3HT and even inorganic materials, indium tin oxide and gold, showed similar electrical potential perturbations dependent on the concentration of F4TCNQ in overlying solutions as the dopant radical anions maximally covered the surfaces. This suggests that there are limited electroactive sites for F4TCNQ binding on electron donor surfaces which results in a similar number of positive charges in film materials forming dipoles with the F4TCNQ radical counteranions. The effect of electron acceptors such as 7,7,8,8-tetracyanoquinodimethane and tetracyanoethylene was compared with that of F4TCNQ in terms of $$V_{th}$$ shift using our analytical tool, with differences attributed to acceptor size and reduction potential. Meanwhile, this FET analysis tool offered a means of monitoring the physical diffusion of small molecules, exemplified by F4TCNQ, in the passive polymer polystyrene, driven by concentration gradients. The technique allows for nondestructive, nonspectroscopic, ambient characterization of electron donor-acceptor interactions at surfaces.

Authors:
ORCiD logo [1];  [1]; ORCiD logo [1];  [1];  [1]; ORCiD logo [1]
  1. Johns Hopkins Univ., Baltimore, MD (United States)
Publication Date:
Research Org.:
Johns Hopkins Univ., Baltimore, MD (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1593829
Grant/Contract Number:  
FG02-07ER46465; NSF/1708245; NSF/1807292
Resource Type:
Accepted Manuscript
Journal Name:
Journal of the American Chemical Society
Additional Journal Information:
Journal Volume: 141; Journal Issue: 12; Journal ID: ISSN 0002-7863
Publisher:
American Chemical Society (ACS)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; Impurities; Diffusion; Organic polymers; Doping; Polymers

Citation Formats

Jang, Hyun-June, Wagner, Justine, Li, Hui, Zhang, Qingyang, Mukhopadhyaya, Tushita, and Katz, Howard E. Analytical Platform To Characterize Dopant Solution Concentrations, Charge Carrier Densities in Films and Interfaces, and Physical Diffusion in Polymers Utilizing Remote Field-Effect Transistors. United States: N. p., 2019. Web. doi:10.1021/jacs.8b13026.
Jang, Hyun-June, Wagner, Justine, Li, Hui, Zhang, Qingyang, Mukhopadhyaya, Tushita, & Katz, Howard E. Analytical Platform To Characterize Dopant Solution Concentrations, Charge Carrier Densities in Films and Interfaces, and Physical Diffusion in Polymers Utilizing Remote Field-Effect Transistors. United States. https://doi.org/10.1021/jacs.8b13026
Jang, Hyun-June, Wagner, Justine, Li, Hui, Zhang, Qingyang, Mukhopadhyaya, Tushita, and Katz, Howard E. Thu . "Analytical Platform To Characterize Dopant Solution Concentrations, Charge Carrier Densities in Films and Interfaces, and Physical Diffusion in Polymers Utilizing Remote Field-Effect Transistors". United States. https://doi.org/10.1021/jacs.8b13026. https://www.osti.gov/servlets/purl/1593829.
@article{osti_1593829,
title = {Analytical Platform To Characterize Dopant Solution Concentrations, Charge Carrier Densities in Films and Interfaces, and Physical Diffusion in Polymers Utilizing Remote Field-Effect Transistors},
author = {Jang, Hyun-June and Wagner, Justine and Li, Hui and Zhang, Qingyang and Mukhopadhyaya, Tushita and Katz, Howard E.},
abstractNote = {Characterizing doping effects in a conductive polymer and physical diffusion in a passive polymer were performed using a remote-gate field-effect transistor (RG FET) detection system that was able to measure the electrical potential perturbation of a polymer film coupled to the gate of a silicon FET. Poly(3-hexylthiophene) (P3HT) film doped using various concentrations of 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F4TCNQ) solutions imposed additional positive potentials on the P3HT RG, resulting in a lower threshold voltage ($V_{th}$) on the n-channel silicon FET. Changes in $V_{th}$ were related to the induced hole concentrations and hole mobility in P3HT films by using our $V_{th}$ shifting model for the RG FET. We discovered that the electron-donating P3HT and even inorganic materials, indium tin oxide and gold, showed similar electrical potential perturbations dependent on the concentration of F4TCNQ in overlying solutions as the dopant radical anions maximally covered the surfaces. This suggests that there are limited electroactive sites for F4TCNQ binding on electron donor surfaces which results in a similar number of positive charges in film materials forming dipoles with the F4TCNQ radical counteranions. The effect of electron acceptors such as 7,7,8,8-tetracyanoquinodimethane and tetracyanoethylene was compared with that of F4TCNQ in terms of $V_{th}$ shift using our analytical tool, with differences attributed to acceptor size and reduction potential. Meanwhile, this FET analysis tool offered a means of monitoring the physical diffusion of small molecules, exemplified by F4TCNQ, in the passive polymer polystyrene, driven by concentration gradients. The technique allows for nondestructive, nonspectroscopic, ambient characterization of electron donor-acceptor interactions at surfaces.},
doi = {10.1021/jacs.8b13026},
journal = {Journal of the American Chemical Society},
number = 12,
volume = 141,
place = {United States},
year = {Thu Feb 28 00:00:00 EST 2019},
month = {Thu Feb 28 00:00:00 EST 2019}
}

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Works referencing / citing this record:

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