Evaluation of magnetic field error in ExtendedEBIS

Ikeda, Shunsuke; Beebe, Edward; Kanesue, Takeshi; Kondrashev, Sergey; Okamura, Masahiro

doi:10.1063/1.5128425

Title: Evaluation of magnetic field error in ExtendedEBIS

Abstract

The upgrade of the EBIS, called ExtendedEBIS, is now in progress in Brookhaven National Laboratory. Two 5T-superconducting solenoids have been placed in series with 200 mm distance from each other for higher trap capacity and production of polarized 3He ions. Since the two superconducting solenoids are used, the field error is expected to be larger. In this research, the field error is estimated based on simulation. It was found that the magnetic field line can be 17 mm off from the center axis at the entrance of the collector, and this offset can be adjusted by three types of correction coils. Additionally, mismatch of the spin direction of polarized 3He due to the misalignment was estimated to be small.

Authors:

;

Publication Date:: Thu Jan 23 00:00:00 EST 2020

Sponsoring Org.:: USDOE

OSTI Identifier:: 1593488

Grant/Contract Number:: AC02-98CH10886

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Review of Scientific Instruments

Additional Journal Information:: Journal Name: Review of Scientific Instruments Journal Volume: 91 Journal Issue: 1; Journal ID: ISSN 0034-6748

Publisher:: American Institute of Physics

Country of Publication:: United States

Language:: English

Citation Formats


                    Ikeda, Shunsuke, Beebe, Edward, Kanesue, Takeshi, Kondrashev, Sergey, and Okamura, Masahiro. Evaluation of magnetic field error in ExtendedEBIS.  United States: N. p., 2020. 
Web.  doi:10.1063/1.5128425.

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                    Ikeda, Shunsuke, Beebe, Edward, Kanesue, Takeshi, Kondrashev, Sergey, & Okamura, Masahiro. Evaluation of magnetic field error in ExtendedEBIS.  United States.  https://doi.org/10.1063/1.5128425

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                    Ikeda, Shunsuke, Beebe, Edward, Kanesue, Takeshi, Kondrashev, Sergey, and Okamura, Masahiro. Thu .  
"Evaluation of magnetic field error in ExtendedEBIS".  United States.  https://doi.org/10.1063/1.5128425.

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@article{osti_1593488,

  title        = {Evaluation of magnetic field error in ExtendedEBIS},

  author       = {Ikeda, Shunsuke and Beebe, Edward and Kanesue, Takeshi and Kondrashev, Sergey and Okamura, Masahiro},

  abstractNote = {The upgrade of the EBIS, called ExtendedEBIS, is now in progress in Brookhaven National Laboratory. Two 5T-superconducting solenoids have been placed in series with 200 mm distance from each other for higher trap capacity and production of polarized 3He ions. Since the two superconducting solenoids are used, the field error is expected to be larger. In this research, the field error is estimated based on simulation. It was found that the magnetic field line can be 17 mm off from the center axis at the entrance of the collector, and this offset can be adjusted by three types of correction coils. Additionally, mismatch of the spin direction of polarized 3He due to the misalignment was estimated to be small.},

  doi          = {10.1063/1.5128425},

  journal      = {Review of Scientific Instruments},

  number       = 1,

  volume       = 91,

  place        = {United States},

  year         = {Thu Jan 23 00:00:00 EST 2020},

  month        = {Thu Jan 23 00:00:00 EST 2020}

}

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Works referenced in this record:

Electron and ion beam simulations for the BNL ExtendedEBIS at Brookhaven National Laboratory
conference, January 2018

Ikeda, S.; Beebe, E.; Okamura, M.
Proceedings of the 17th International Conference on Ion Sources, AIP Conference Proceedings
DOI: 10.1063/1.5053350

Reliable operation of the Brookhaven EBIS for highly charged ion production for RHIC and NSRL
conference, January 2015

Beebe, E.; Alessi, J.; Binello, S.
PROCEEDINGS OF THE XII INTERNATIONAL SYMPOSIUM ON ELECTRON BEAM ION SOURCES AND TRAPS, AIP Conference Proceedings
DOI: 10.1063/1.4905394

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Title: Evaluation of magnetic field error in ExtendedEBIS

Abstract

Citation Formats

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