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Title: Evaluation of magnetic field error in ExtendedEBIS

Authors:
ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]
  1. Collider-Accelerator Department, Brookhaven National Laboratory, Upton, New York 11973, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1593488
Grant/Contract Number:  
AC02-98CH10886
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 91 Journal Issue: 1; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Ikeda, Shunsuke, Beebe, Edward, Kanesue, Takeshi, Kondrashev, Sergey, and Okamura, Masahiro. Evaluation of magnetic field error in ExtendedEBIS. United States: N. p., 2020. Web. doi:10.1063/1.5128425.
Ikeda, Shunsuke, Beebe, Edward, Kanesue, Takeshi, Kondrashev, Sergey, & Okamura, Masahiro. Evaluation of magnetic field error in ExtendedEBIS. United States. doi:10.1063/1.5128425.
Ikeda, Shunsuke, Beebe, Edward, Kanesue, Takeshi, Kondrashev, Sergey, and Okamura, Masahiro. Wed . "Evaluation of magnetic field error in ExtendedEBIS". United States. doi:10.1063/1.5128425.
@article{osti_1593488,
title = {Evaluation of magnetic field error in ExtendedEBIS},
author = {Ikeda, Shunsuke and Beebe, Edward and Kanesue, Takeshi and Kondrashev, Sergey and Okamura, Masahiro},
abstractNote = {},
doi = {10.1063/1.5128425},
journal = {Review of Scientific Instruments},
number = 1,
volume = 91,
place = {United States},
year = {2020},
month = {1}
}

Journal Article:
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This content will become publicly available on January 23, 2021
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Works referenced in this record:

Electron and ion beam simulations for the BNL ExtendedEBIS at Brookhaven National Laboratory
conference, January 2018

  • Ikeda, S.; Beebe, E.; Okamura, M.
  • Proceedings of the 17th International Conference on Ion Sources, AIP Conference Proceedings
  • DOI: 10.1063/1.5053350

Reliable operation of the Brookhaven EBIS for highly charged ion production for RHIC and NSRL
conference, January 2015

  • Beebe, E.; Alessi, J.; Binello, S.
  • PROCEEDINGS OF THE XII INTERNATIONAL SYMPOSIUM ON ELECTRON BEAM ION SOURCES AND TRAPS, AIP Conference Proceedings
  • DOI: 10.1063/1.4905394