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Title: Understanding chromaticity shifts in LED devices through analytical models

Authors:
ORCiD logo; ; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1582888
Grant/Contract Number:  
[EE-0007081]
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Microelectronics and Reliability
Additional Journal Information:
[Journal Name: Microelectronics and Reliability Journal Volume: 84 Journal Issue: C]; Journal ID: ISSN 0026-2714
Publisher:
Elsevier
Country of Publication:
United Kingdom
Language:
English

Citation Formats

Davis, J. Lynn, Mills, Karmann C., Bobashev, Georgiy, Rountree, Kelley J., Lamvik, Michael, Yaga, Robert, and Johnson, Cortina. Understanding chromaticity shifts in LED devices through analytical models. United Kingdom: N. p., 2018. Web. doi:10.1016/j.microrel.2018.03.023.
Davis, J. Lynn, Mills, Karmann C., Bobashev, Georgiy, Rountree, Kelley J., Lamvik, Michael, Yaga, Robert, & Johnson, Cortina. Understanding chromaticity shifts in LED devices through analytical models. United Kingdom. doi:10.1016/j.microrel.2018.03.023.
Davis, J. Lynn, Mills, Karmann C., Bobashev, Georgiy, Rountree, Kelley J., Lamvik, Michael, Yaga, Robert, and Johnson, Cortina. Tue . "Understanding chromaticity shifts in LED devices through analytical models". United Kingdom. doi:10.1016/j.microrel.2018.03.023.
@article{osti_1582888,
title = {Understanding chromaticity shifts in LED devices through analytical models},
author = {Davis, J. Lynn and Mills, Karmann C. and Bobashev, Georgiy and Rountree, Kelley J. and Lamvik, Michael and Yaga, Robert and Johnson, Cortina},
abstractNote = {},
doi = {10.1016/j.microrel.2018.03.023},
journal = {Microelectronics and Reliability},
number = [C],
volume = [84],
place = {United Kingdom},
year = {2018},
month = {5}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.microrel.2018.03.023

Citation Metrics:
Cited by: 1 work
Citation information provided by
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