Proximity-induced superconductivity in a topological crystalline insulator

Rachmilowitz, Bryan; Zhao, He; Li, Hong; LaFleur, Alexander; Schneeloch, J.; Zhong, Ruidan; Gu, Genda; Zeljkovic, Ilija

doi:10.1103/PhysRevB.100.241402

Title: Proximity-induced superconductivity in a topological crystalline insulator

Journal Article · 03 December 2019 · Physical Review B

DOI: https://doi.org/10.1103/PhysRevB.100.241402 · OSTI ID:1581238

Rachmilowitz, Bryan ^[1]; Zhao, He ^[1]; Li, Hong ^[1]; LaFleur, Alexander ^[1]; Schneeloch, J. ^[2]; Zhong, Ruidan ^[2];

^[2];

^[1]

Boston College, Chestnut Hill, MA (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States)

Superconducting topological crystalline insulators (TCIs) are anticipated to host new topological phases protected by crystalline symmetries, but available materials are insufficiently suitable for surface studies. To induce superconductivity at the surface of a prototypical TCI SnTe, we use molecular beam epitaxy to grow a heterostructure of SnTe and a high-T_c superconductor Fe(Te,Se), utilizing a “buffer” layer to bridge the large lattice mismatch between SnTe and Fe(Te,Se). Using low-temperature scanning tunneling microscopy and spectroscopy, we measure a prominent spectral gap on the surface of SnTe, and demonstrate its superconducting origin by its dependence on temperature and magnetic field. This report offers a platform for atomic-scale investigations of emergent topological phenomena in superconducting TCIs.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Science Foundation; Army Research Office (ARO)

Grant/Contract Number:: SC0012704

OSTI ID:: 1581238

Report Number(s):: BNL--212486-2019-JAAM

Journal Information:: Physical Review B, Journal Name: Physical Review B Journal Issue: 24 Vol. 100; ISSN 2469-9950; ISSN PRBMDO

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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