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Title: Carrier Lifetimes of Iodine-Doped CdMgTe/CdSeTe Double Heterostructures Grown by Molecular Beam Epitaxy

Abstract

Iodine-doped CdMgTe/CdSeTe double heterostructures (DHs) have been grown by molecular beam epitaxy and studied using time-resolved photoluminescence (PL), focusing on absorber layer thickness of 2 μm. The n-type free carrier concentration was varied to ~7 × 1015 cm–3, 8.4 × 1016 cm–3, and 8.4 × 1017 cm–3 using iodine as dopant in DHs. Optical injection at 1 × 1010 photons/pulse/cm2 to 3 × 1011 photons/pulse/cm2, corresponding to initial injection of photocarriers up to ~8 × 1015 cm–3, was applied to examine the effects of excess carrier concentration on the PL lifetimes. Iodine-doped DHs exhibited an initial rapid decay followed by a slower decay at free carrier concentration of 7 × 1015 cm–3 and 8.4 × 1016 cm–3. The optical injection dependence of the carrier lifetimes for DHs was interpreted based on the Shockley–Read–Hall model. Furthermore, the observed decrease in lifetime with increasing n is consistent with growing importance of radiative recombination.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Texas State Univ., San Marcos, TX (United States)
Publication Date:
Research Org.:
Texas State Univ., San Marcos, TX (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
OSTI Identifier:
1580431
Grant/Contract Number:  
EE0007541; AC36-08GO28308
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Electronic Materials
Additional Journal Information:
Journal Volume: 46; Journal Issue: 9; Journal ID: ISSN 0361-5235
Publisher:
Springer
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; CdTe; heterostructures; photoluminescence; lifetime

Citation Formats

Sohal, Sandeep, Edirisooriya, M., Ogedengbe, O. S., Petersen, J. E., Swartz, C. H., LeBlanc, E. G., Myers, T. H., Li, J. V., and Holtz, M. Carrier Lifetimes of Iodine-Doped CdMgTe/CdSeTe Double Heterostructures Grown by Molecular Beam Epitaxy. United States: N. p., 2017. Web. doi:10.1007/s11664-017-5646-y.
Sohal, Sandeep, Edirisooriya, M., Ogedengbe, O. S., Petersen, J. E., Swartz, C. H., LeBlanc, E. G., Myers, T. H., Li, J. V., & Holtz, M. Carrier Lifetimes of Iodine-Doped CdMgTe/CdSeTe Double Heterostructures Grown by Molecular Beam Epitaxy. United States. https://doi.org/10.1007/s11664-017-5646-y
Sohal, Sandeep, Edirisooriya, M., Ogedengbe, O. S., Petersen, J. E., Swartz, C. H., LeBlanc, E. G., Myers, T. H., Li, J. V., and Holtz, M. Wed . "Carrier Lifetimes of Iodine-Doped CdMgTe/CdSeTe Double Heterostructures Grown by Molecular Beam Epitaxy". United States. https://doi.org/10.1007/s11664-017-5646-y. https://www.osti.gov/servlets/purl/1580431.
@article{osti_1580431,
title = {Carrier Lifetimes of Iodine-Doped CdMgTe/CdSeTe Double Heterostructures Grown by Molecular Beam Epitaxy},
author = {Sohal, Sandeep and Edirisooriya, M. and Ogedengbe, O. S. and Petersen, J. E. and Swartz, C. H. and LeBlanc, E. G. and Myers, T. H. and Li, J. V. and Holtz, M.},
abstractNote = {Iodine-doped CdMgTe/CdSeTe double heterostructures (DHs) have been grown by molecular beam epitaxy and studied using time-resolved photoluminescence (PL), focusing on absorber layer thickness of 2 μm. The n-type free carrier concentration was varied to ~7 × 1015 cm–3, 8.4 × 1016 cm–3, and 8.4 × 1017 cm–3 using iodine as dopant in DHs. Optical injection at 1 × 1010 photons/pulse/cm2 to 3 × 1011 photons/pulse/cm2, corresponding to initial injection of photocarriers up to ~8 × 1015 cm–3, was applied to examine the effects of excess carrier concentration on the PL lifetimes. Iodine-doped DHs exhibited an initial rapid decay followed by a slower decay at free carrier concentration of 7 × 1015 cm–3 and 8.4 × 1016 cm–3. The optical injection dependence of the carrier lifetimes for DHs was interpreted based on the Shockley–Read–Hall model. Furthermore, the observed decrease in lifetime with increasing n is consistent with growing importance of radiative recombination.},
doi = {10.1007/s11664-017-5646-y},
journal = {Journal of Electronic Materials},
number = 9,
volume = 46,
place = {United States},
year = {Wed Jun 21 00:00:00 EDT 2017},
month = {Wed Jun 21 00:00:00 EDT 2017}
}

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Works referenced in this record:

Minority-Carrier Lifetime and Surface Recombination Velocity in Single-Crystal CdTe
journal, January 2015


Minority Carrier Lifetime Analysis in the Bulk of Thin-Film Absorbers Using Subbandgap (Two-Photon) Excitation
journal, October 2013


Radiative and interfacial recombination in CdTe heterostructures
journal, December 2014

  • Swartz, C. H.; Edirisooriya, M.; LeBlanc, E. G.
  • Applied Physics Letters, Vol. 105, Issue 22
  • DOI: 10.1063/1.4902926

Determination of CdTe bulk carrier lifetime and interface recombination velocity of CdTe/MgCdTe double heterostructures grown by molecular beam epitaxy
journal, December 2014

  • Zhao, Xin-Hao; DiNezza, Michael J.; Liu, Shi
  • Applied Physics Letters, Vol. 105, Issue 25
  • DOI: 10.1063/1.4904993

Monocrystalline CdTe solar cells with open-circuit voltage over 1 V and efficiency of 17%
journal, May 2016


Impact of extended defects on recombination in CdTe heterostructures grown by molecular beam epitaxy
journal, August 2016

  • Zaunbrecher, Katherine N.; Kuciauskas, Darius; Swartz, Craig H.
  • Applied Physics Letters, Vol. 109, Issue 9
  • DOI: 10.1063/1.4961989

Unusually Low Surface-Recombination Velocity on Silicon and Germanium Surfaces
journal, July 1986

  • Yablonovitch, E.; Allara, D. L.; Chang, C. C.
  • Physical Review Letters, Vol. 57, Issue 2, p. 249-252
  • DOI: 10.1103/PhysRevLett.57.249

Nearly ideal electronic properties of sulfide coated GaAs surfaces
journal, August 1987

  • Yablonovitch, E.; Sandroff, C. J.; Bhat, R.
  • Applied Physics Letters, Vol. 51, Issue 6
  • DOI: 10.1063/1.98415

Intensity‐dependent minority‐carrier lifetime in III‐V semiconductors due to saturation of recombination centers
journal, July 1991

  • Ahrenkiel, R. K.; Keyes, B. M.; Dunlavy, D. J.
  • Journal of Applied Physics, Vol. 70, Issue 1
  • DOI: 10.1063/1.350315

Optical properties of CdTe: Experiment and modeling
journal, September 1993

  • Adachi, Sadao; Kimura, Toshifumi; Suzuki, Norihiro
  • Journal of Applied Physics, Vol. 74, Issue 5
  • DOI: 10.1063/1.354543

Optical enhancement of the open-circuit voltage in high quality GaAs solar cells
journal, March 2013

  • Steiner, M. A.; Geisz, J. F.; García, I.
  • Journal of Applied Physics, Vol. 113, Issue 12
  • DOI: 10.1063/1.4798267

Statistics of the Recombinations of Holes and Electrons
journal, September 1952


Theoretical analysis of non-radiative multiphonon recombination activity of intrinsic defects in CdTe
journal, February 2016

  • Krasikov, D. N.; Scherbinin, A. V.; Knizhnik, A. A.
  • Journal of Applied Physics, Vol. 119, Issue 8
  • DOI: 10.1063/1.4942529

Shockley-Read-Hall lifetimes in CdTe
journal, July 2014

  • Buurma, C.; Krishnamurthy, S.; Sivananthan, S.
  • Journal of Applied Physics, Vol. 116, Issue 1
  • DOI: 10.1063/1.4886386

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