Visualizing quantum phenomena at complex oxide interfaces: An atomic view from scanning transmission electron microscopy

Guo, Hangwen; Saghayezhian, Mohammad; Wang, Zhen; Zhu, Yimei; Zhang, Jiandi; Plummer, Ward

doi:10.1007/s11467-019-0942-z

Title: Visualizing quantum phenomena at complex oxide interfaces: An atomic view from scanning transmission electron microscopy

Journal Article · 27 November 2019 · Frontiers of Physics

DOI: https://doi.org/10.1007/s11467-019-0942-z · OSTI ID:1580241

Guo, Hangwen ^[1]; Saghayezhian, Mohammad ^[2]; Wang, Zhen ^[3];

^[4]; Zhang, Jiandi ^[2]; Plummer, Ward ^[2]

Fudan Univ., Shanghai (China)
Louisiana State Univ., Baton Rouge, LA (United States)
Louisiana State Univ., Baton Rouge, LA (United States); Brookhaven National Lab. (BNL), Upton, NY (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States)

Complex oxide interfaces have been one of the central focuses in condensed matter physics and material science. Over the past decade, aberration corrected scanning transmission electron microscopy and spectroscopy has proven to be invaluable to visualize and understand the emerging quantum phenomena at an interface. In this paper, we briefly review some recent progress in the utilization of electron microscopy to probe interfaces. Furthermore, we discuss several important challenges for electron microscopy to advance our understanding on interface phenomena, from the perspective of variable temperature, magnetism, electron energy loss spectroscopy analysis, electronic symmetry, and defects probing.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division

Grant/Contract Number:: SC0012704

OSTI ID:: 1580241

Report Number(s):: BNL--212471-2019-JAAM

Journal Information:: Frontiers of Physics, Journal Name: Frontiers of Physics Journal Issue: 1 Vol. 15; ISSN 2095-0462

Publisher:: SpringerCopyright Statement

Country of Publication:: United States

Language:: English

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