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Title: Materials and Devices with Probes and Beams: Down to the Atomic Level and Back Up

 [1];  [1]
  1. Center for Nanophase Materials SciencesOak Ridge National Laboratory Oak Ridge TN 37831 USA
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Advanced Functional Materials
Additional Journal Information:
Journal Name: Advanced Functional Materials Journal Volume: 29 Journal Issue: 52; Journal ID: ISSN 1616-301X
Wiley Blackwell (John Wiley & Sons)
Country of Publication:

Citation Formats

Kalinin, Sergei V., and Dyck, Ondrej. Materials and Devices with Probes and Beams: Down to the Atomic Level and Back Up. Germany: N. p., 2019. Web. doi:10.1002/adfm.201908267.
Kalinin, Sergei V., & Dyck, Ondrej. Materials and Devices with Probes and Beams: Down to the Atomic Level and Back Up. Germany. doi:10.1002/adfm.201908267.
Kalinin, Sergei V., and Dyck, Ondrej. Mon . "Materials and Devices with Probes and Beams: Down to the Atomic Level and Back Up". Germany. doi:10.1002/adfm.201908267.
title = {Materials and Devices with Probes and Beams: Down to the Atomic Level and Back Up},
author = {Kalinin, Sergei V. and Dyck, Ondrej},
abstractNote = {},
doi = {10.1002/adfm.201908267},
journal = {Advanced Functional Materials},
number = 52,
volume = 29,
place = {Germany},
year = {2019},
month = {12}

Journal Article:
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