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Title: Non-thermal fluence threshold for femtosecond pulsed x-ray radiation damage in perovskite complex oxide epitaxial heterostructures

Authors:
ORCiD logo [1];  [1];  [1];  [2];  [3];  [3]; ORCiD logo [3];  [3];  [4];  [4];  [4]; ORCiD logo [4];  [5]; ORCiD logo [6];  [7]; ORCiD logo [1]
  1. Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
  2. Department of Physics, DePaul University, Chicago, Illinois 60614, USA
  3. School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 61005, South Korea
  4. Pohang Accelerator Laboratory, Pohang, Gyeongbuk 37673, South Korea
  5. Department of Applied Physics, Stanford University, Stanford, California 94305, USA
  6. Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA, Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853, USA
  7. X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1579771
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Name: Applied Physics Letters Journal Volume: 115 Journal Issue: 25; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Lee, Hyeon Jun, Ahn, Youngjun, Marks, Samuel D., Landahl, Eric C., Lee, Jun Young, Kim, Tae Yeon, Unithrattil, Sanjith, Jo, Ji Young, Chun, Sae Hwan, Kim, Sunam, Park, Sang-Yeon, Eom, Intae, Adamo, Carolina, Schlom, Darrell G., Wen, Haidan, and Evans, Paul G. Non-thermal fluence threshold for femtosecond pulsed x-ray radiation damage in perovskite complex oxide epitaxial heterostructures. United States: N. p., 2019. Web. doi:10.1063/1.5128509.
Lee, Hyeon Jun, Ahn, Youngjun, Marks, Samuel D., Landahl, Eric C., Lee, Jun Young, Kim, Tae Yeon, Unithrattil, Sanjith, Jo, Ji Young, Chun, Sae Hwan, Kim, Sunam, Park, Sang-Yeon, Eom, Intae, Adamo, Carolina, Schlom, Darrell G., Wen, Haidan, & Evans, Paul G. Non-thermal fluence threshold for femtosecond pulsed x-ray radiation damage in perovskite complex oxide epitaxial heterostructures. United States. doi:10.1063/1.5128509.
Lee, Hyeon Jun, Ahn, Youngjun, Marks, Samuel D., Landahl, Eric C., Lee, Jun Young, Kim, Tae Yeon, Unithrattil, Sanjith, Jo, Ji Young, Chun, Sae Hwan, Kim, Sunam, Park, Sang-Yeon, Eom, Intae, Adamo, Carolina, Schlom, Darrell G., Wen, Haidan, and Evans, Paul G. Mon . "Non-thermal fluence threshold for femtosecond pulsed x-ray radiation damage in perovskite complex oxide epitaxial heterostructures". United States. doi:10.1063/1.5128509.
@article{osti_1579771,
title = {Non-thermal fluence threshold for femtosecond pulsed x-ray radiation damage in perovskite complex oxide epitaxial heterostructures},
author = {Lee, Hyeon Jun and Ahn, Youngjun and Marks, Samuel D. and Landahl, Eric C. and Lee, Jun Young and Kim, Tae Yeon and Unithrattil, Sanjith and Jo, Ji Young and Chun, Sae Hwan and Kim, Sunam and Park, Sang-Yeon and Eom, Intae and Adamo, Carolina and Schlom, Darrell G. and Wen, Haidan and Evans, Paul G.},
abstractNote = {},
doi = {10.1063/1.5128509},
journal = {Applied Physics Letters},
number = 25,
volume = 115,
place = {United States},
year = {2019},
month = {12}
}

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