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Title: X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?

Abstract

X-ray beams at energies tuned slightly below that of exact backscattering (extreme conditions, where X-ray back-diffraction is almost extinguished – called residual XBD) are better focused if the experiment is carried out at lower energies in order to avoid multiple-beam diffraction effects. Following previous work by the authors [Hönnicke, Conley, Cusatis, Kakuno, Zhou, Bouet, Marques & Vicentin (2014). J. Appl. Cryst.47, 1658–1665], herein efforts are directed towards characterizing the residual XBD beam of an ultra-thin Si 220 crystal (UTSiXTAL) at ~3.2 keV. To achieve the residual XBD condition the UTSiXTAL was cooled from 310 to 273 K. The findings suggest that under this extreme condition the energy resolution can be also improved. Issues with the energy resolution measurements due to incoming beam divergence and the ultra-thin crystal flatness are discussed.

Authors:
ORCiD logo [1]; ORCiD logo [2];  [3];  [4]; ORCiD logo [3];  [3];  [5];  [5]; ORCiD logo [5];  [6];  [7]
  1. Federal Univ. for Latin American Integration (UNILA), Foz do Iguaçu, Paraná (Brazil)
  2. Federal Univ. of Parana (UFPR), Curitiba, Paraná (Brazil)
  3. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  4. Federal Univ. of Pampa (Unipampa), Rio Grande (Brazil)
  5. Brookhaven National Lab. (BNL), Upton, NY (United States)
  6. Federal Univ. of Mato Grosso (UFMT), Cuiabá (Brazil)
  7. National Synchrotron Light Lab. (LNLS), Sao Paulo (Brazil)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1579490
Report Number(s):
BNL-212397-2019-JAAM
Journal ID: ISSN 1600-5767; JACGAR
Grant/Contract Number:  
SC0012704; AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Applied Crystallography (Online)
Additional Journal Information:
Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 52; Journal Issue: 6; Journal ID: ISSN 1600-5767
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; low-energy X-ray back-diffraction; ultra-thin crystals; quartz X-ray analysers; multiple beam diffraction

Citation Formats

Hönnicke, Marcelo Goncalves, Cusatis, Cesar, Conley, Raymond, Kakuno, Edson Massayuki, Kasman, Elina, Huang, XianRong, Bouet, Nathalie, Zhou, Juan, Cai, Yong Q., Basso Marques, Joao, and Vicentin, Flavio Cesar. X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?. United States: N. p., 2019. Web. doi:10.1107/S1600576719012925.
Hönnicke, Marcelo Goncalves, Cusatis, Cesar, Conley, Raymond, Kakuno, Edson Massayuki, Kasman, Elina, Huang, XianRong, Bouet, Nathalie, Zhou, Juan, Cai, Yong Q., Basso Marques, Joao, & Vicentin, Flavio Cesar. X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?. United States. doi:10.1107/S1600576719012925.
Hönnicke, Marcelo Goncalves, Cusatis, Cesar, Conley, Raymond, Kakuno, Edson Massayuki, Kasman, Elina, Huang, XianRong, Bouet, Nathalie, Zhou, Juan, Cai, Yong Q., Basso Marques, Joao, and Vicentin, Flavio Cesar. Sun . "X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?". United States. doi:10.1107/S1600576719012925.
@article{osti_1579490,
title = {X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?},
author = {Hönnicke, Marcelo Goncalves and Cusatis, Cesar and Conley, Raymond and Kakuno, Edson Massayuki and Kasman, Elina and Huang, XianRong and Bouet, Nathalie and Zhou, Juan and Cai, Yong Q. and Basso Marques, Joao and Vicentin, Flavio Cesar},
abstractNote = {X-ray beams at energies tuned slightly below that of exact backscattering (extreme conditions, where X-ray back-diffraction is almost extinguished – called residual XBD) are better focused if the experiment is carried out at lower energies in order to avoid multiple-beam diffraction effects. Following previous work by the authors [Hönnicke, Conley, Cusatis, Kakuno, Zhou, Bouet, Marques & Vicentin (2014).J. Appl. Cryst.47, 1658–1665], herein efforts are directed towards characterizing the residual XBD beam of an ultra-thin Si 220 crystal (UTSiXTAL) at ~3.2 keV. To achieve the residual XBD condition the UTSiXTAL was cooled from 310 to 273 K. The findings suggest that under this extreme condition the energy resolution can be also improved. Issues with the energy resolution measurements due to incoming beam divergence and the ultra-thin crystal flatness are discussed.},
doi = {10.1107/S1600576719012925},
journal = {Journal of Applied Crystallography (Online)},
number = 6,
volume = 52,
place = {United States},
year = {2019},
month = {12}
}

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