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Title: X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?

Journal Article · · Journal of Applied Crystallography (Online)
ORCiD logo [1]; ORCiD logo [2];  [3];  [4]; ORCiD logo [3];  [3];  [5];  [5]; ORCiD logo [5];  [6];  [7]
  1. Federal Univ. for Latin American Integration (UNILA), Foz do Iguaçu, Paraná (Brazil)
  2. Federal Univ. of Parana (UFPR), Curitiba, Paraná (Brazil)
  3. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  4. Federal Univ. of Pampa (Unipampa), Rio Grande (Brazil)
  5. Brookhaven National Lab. (BNL), Upton, NY (United States)
  6. Federal Univ. of Mato Grosso (UFMT), Cuiabá (Brazil)
  7. National Synchrotron Light Lab. (LNLS), Sao Paulo (Brazil)
+ Show Author Affiliations

X-ray beams at energies tuned slightly below that of exact backscattering (extreme conditions, where X-ray back-diffraction is almost extinguished – called residual XBD) are better focused if the experiment is carried out at lower energies in order to avoid multiple-beam diffraction effects. Following previous work by the authors [Hönnicke, Conley, Cusatis, Kakuno, Zhou, Bouet, Marques & Vicentin (2014).J. Appl. Cryst.47, 1658–1665], herein efforts are directed towards characterizing the residual XBD beam of an ultra-thin Si 220 crystal (UTSiXTAL) at ~3.2 keV. To achieve the residual XBD condition the UTSiXTAL was cooled from 310 to 273 K. The findings suggest that under this extreme condition the energy resolution can be also improved. Issues with the energy resolution measurements due to incoming beam divergence and the ultra-thin crystal flatness are discussed.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Grant/Contract Number:
AC02-06CH11357; SC0012704
OSTI ID:
1579490
Report Number(s):
BNL--212397-2019-JAAM
Journal Information:
Journal of Applied Crystallography (Online), Journal Name: Journal of Applied Crystallography (Online) Journal Issue: 6 Vol. 52; ISSN 1600-5767; ISSN JACGAR
Publisher:
International Union of CrystallographyCopyright Statement
Country of Publication:
United States
Language:
English

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36 MATERIALS SCIENCE
low-energy X-ray back-diffraction
multiple beam diffraction
quartz X-ray analysers
ultra-thin crystals