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Title: X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe 3

Abstract

Synchrotron X-ray Scanning Tunneling Microscopy (SX-STM) is a novel imaging technique capable of providing real space chemically specific mapping with a potential of reaching atomic resolution. Determination of chemical composition along with ultra-high resolution imaging by SX-STM can be realized through excitation of core electrons by incident X-rays when their energy is tuned to an absorption edge of a particular atom during raster scanning, as is done in the conventional STM experiments. In this work, we provide a brief summary and the current status of SX-STM and discuss its applications for material science. In particular, we discuss instrumentation challenges associated with the SX-STM technique and present early experiments on Cu doped ZrTe 3 single crystals.

Authors:
 [1];  [2];  [3];  [2];  [3];  [3];  [3];  [2]; ORCiD logo [3]
  1. Univ. of Louisiana at Lafayette, Lafayette, LA (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
Brookhaven National Laboratory (BNL), Laboratory Directed Research and Development; USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Scientific User Facilities Division
OSTI Identifier:
1576223
Alternate Identifier(s):
OSTI ID: 1577254
Report Number(s):
BNL-212361-2019-JAAM
Journal ID: ISSN 2073-4352; CRYSBC
Grant/Contract Number:  
SC0012704; AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Crystals
Additional Journal Information:
Journal Volume: 9; Journal Issue: 11; Journal ID: ISSN 2073-4352
Publisher:
MDPI
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; SX-STM; scanning microscopy; synchrotron; smart tips; elemental mapping; scanning microscop

Citation Formats

Yan, Hui, Shirato, Nozomi, Zhu, Xiangde, Rosenmann, Daniel, Tong, Xiao, Xu, Weihe, Petrovic, Cedomir, Rose, Volker, and Nazaretski, Evgeny. X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3. United States: N. p., 2019. Web. doi:10.3390/cryst9110588.
Yan, Hui, Shirato, Nozomi, Zhu, Xiangde, Rosenmann, Daniel, Tong, Xiao, Xu, Weihe, Petrovic, Cedomir, Rose, Volker, & Nazaretski, Evgeny. X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3. United States. doi:10.3390/cryst9110588.
Yan, Hui, Shirato, Nozomi, Zhu, Xiangde, Rosenmann, Daniel, Tong, Xiao, Xu, Weihe, Petrovic, Cedomir, Rose, Volker, and Nazaretski, Evgeny. Sat . "X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3". United States. doi:10.3390/cryst9110588. https://www.osti.gov/servlets/purl/1576223.
@article{osti_1576223,
title = {X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3},
author = {Yan, Hui and Shirato, Nozomi and Zhu, Xiangde and Rosenmann, Daniel and Tong, Xiao and Xu, Weihe and Petrovic, Cedomir and Rose, Volker and Nazaretski, Evgeny},
abstractNote = {Synchrotron X-ray Scanning Tunneling Microscopy (SX-STM) is a novel imaging technique capable of providing real space chemically specific mapping with a potential of reaching atomic resolution. Determination of chemical composition along with ultra-high resolution imaging by SX-STM can be realized through excitation of core electrons by incident X-rays when their energy is tuned to an absorption edge of a particular atom during raster scanning, as is done in the conventional STM experiments. In this work, we provide a brief summary and the current status of SX-STM and discuss its applications for material science. In particular, we discuss instrumentation challenges associated with the SX-STM technique and present early experiments on Cu doped ZrTe3 single crystals.},
doi = {10.3390/cryst9110588},
journal = {Crystals},
number = 11,
volume = 9,
place = {United States},
year = {2019},
month = {11}
}

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