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Title: X-ray Ptychography on low dimensional hard condensed matter materials

Abstract

Tailoring structural, chemical and electronic (dis-)order in heterogeneous media is one of the transformative opportunities to enable new functionalities and sciences in energy and quantum materials. This endeavor requires elemental, chemical, and magnetic sensitivity at the nano/atomic scale in two-and three-dimensional space. Soft and hard x-ray radiation provided by synchrotron facilities have emerged as standard characterization probes owing to their inherent element-specificity and high intensity. One of the most promising methods in view of sensitivity and spatial resolution is coherent diffraction imaging, namely x-ray ptychography, which is envisioned to take on the dominance of electron imaging techniques offering with atomic resolution in the age of diffraction limited light sources. In this review, we discuss current research examples of far-field diffraction-based x-ray ptychography on two-dimensional and three-dimensional semiconductors, ferroelectrics, and ferromagnets, and its blooming future as a mainstream tool for materials sciences.

Authors:
 [1]; ORCiD logo [2];  [3];  [4];  [5];  [3];  [6]
  1. Diamond Light Source Ltd., Oxfordshire (United Kingdom)
  2. Univ. College London, London (United Kingdom); Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  4. TongJi Univ., Shanghai (China); Univ. College London, London (United Kingdom)
  5. Univ. of Cambridge, Cambridge (England)
  6. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1575221
Alternate Identifier(s):
OSTI ID: 1494045
Report Number(s):
BNL-211254-2019-JAAM
Journal ID: ISSN 1931-9401
Grant/Contract Number:  
SC0012704; AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Reviews
Additional Journal Information:
Journal Volume: 6; Journal Issue: 1; Journal ID: ISSN 1931-9401
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Shi, Xiowen, Robinson, Ian K., Burdet, Nicolas, Chen, Bo, Xiong, Gang, Streubel, Robert, and Harder, Ross. X-ray Ptychography on low dimensional hard condensed matter materials. United States: N. p., 2019. Web. doi:10.1063/1.5045131.
Shi, Xiowen, Robinson, Ian K., Burdet, Nicolas, Chen, Bo, Xiong, Gang, Streubel, Robert, & Harder, Ross. X-ray Ptychography on low dimensional hard condensed matter materials. United States. doi:10.1063/1.5045131.
Shi, Xiowen, Robinson, Ian K., Burdet, Nicolas, Chen, Bo, Xiong, Gang, Streubel, Robert, and Harder, Ross. Mon . "X-ray Ptychography on low dimensional hard condensed matter materials". United States. doi:10.1063/1.5045131. https://www.osti.gov/servlets/purl/1575221.
@article{osti_1575221,
title = {X-ray Ptychography on low dimensional hard condensed matter materials},
author = {Shi, Xiowen and Robinson, Ian K. and Burdet, Nicolas and Chen, Bo and Xiong, Gang and Streubel, Robert and Harder, Ross},
abstractNote = {Tailoring structural, chemical and electronic (dis-)order in heterogeneous media is one of the transformative opportunities to enable new functionalities and sciences in energy and quantum materials. This endeavor requires elemental, chemical, and magnetic sensitivity at the nano/atomic scale in two-and three-dimensional space. Soft and hard x-ray radiation provided by synchrotron facilities have emerged as standard characterization probes owing to their inherent element-specificity and high intensity. One of the most promising methods in view of sensitivity and spatial resolution is coherent diffraction imaging, namely x-ray ptychography, which is envisioned to take on the dominance of electron imaging techniques offering with atomic resolution in the age of diffraction limited light sources. In this review, we discuss current research examples of far-field diffraction-based x-ray ptychography on two-dimensional and three-dimensional semiconductors, ferroelectrics, and ferromagnets, and its blooming future as a mainstream tool for materials sciences.},
doi = {10.1063/1.5045131},
journal = {Applied Physics Reviews},
number = 1,
volume = 6,
place = {United States},
year = {2019},
month = {3}
}

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