Thermal neutron-induced single-event upsets in microcontrollers containing boron-10
- Authors:
-
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1574802
- Alternate Identifier(s):
- OSTI ID: 1608680
- Report Number(s):
- SAND2019-7606J; LA-UR-19-26094
Journal ID: ISSN 0018-9499; 677058; TRN: US2001204
- Grant/Contract Number:
- AC04-94AL85000; 89233218CNA000001
- Resource Type:
- Accepted Manuscript
- Journal Name:
- IEEE Transactions on Nuclear Science
- Additional Journal Information:
- Journal Volume: 67; Journal Issue: 1; Conference: Nuclear and Space Radiation Effects Conference (NSREC) ; 2019-07-08 - 2019-07-12 ;; Journal ID: ISSN 0018-9499
- Publisher:
- IEEE
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 73 NUCLEAR PHYSICS AND RADIATION PHYSICS; microcontrollers; neutron; radiation effects; semiconductor device doping; semiconductor device modeling; single event effects; SRAM cells
Citation Formats
Auden, Elizabeth C., Quinn, Heather M., Wender, Stephen A., O'Donnell, John M., Lisowski, Paul W., George, Jeffrey S., Xu, Ning, Black, Dolores A., and Black, Jeffrey D. Thermal neutron-induced single-event upsets in microcontrollers containing boron-10. United States: N. p., 2019.
Web. doi:10.1109/TNS.2019.2951996.
Auden, Elizabeth C., Quinn, Heather M., Wender, Stephen A., O'Donnell, John M., Lisowski, Paul W., George, Jeffrey S., Xu, Ning, Black, Dolores A., & Black, Jeffrey D. Thermal neutron-induced single-event upsets in microcontrollers containing boron-10. United States. doi:10.1109/TNS.2019.2951996.
Auden, Elizabeth C., Quinn, Heather M., Wender, Stephen A., O'Donnell, John M., Lisowski, Paul W., George, Jeffrey S., Xu, Ning, Black, Dolores A., and Black, Jeffrey D. Wed .
"Thermal neutron-induced single-event upsets in microcontrollers containing boron-10". United States. doi:10.1109/TNS.2019.2951996. https://www.osti.gov/servlets/purl/1574802.
@article{osti_1574802,
title = {Thermal neutron-induced single-event upsets in microcontrollers containing boron-10},
author = {Auden, Elizabeth C. and Quinn, Heather M. and Wender, Stephen A. and O'Donnell, John M. and Lisowski, Paul W. and George, Jeffrey S. and Xu, Ning and Black, Dolores A. and Black, Jeffrey D.},
abstractNote = {},
doi = {10.1109/TNS.2019.2951996},
journal = {IEEE Transactions on Nuclear Science},
number = 1,
volume = 67,
place = {United States},
year = {2019},
month = {11}
}
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Cited by: 1 work
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