Thermal neutron-induced single-event upsets in microcontrollers containing boron-10

doi:10.1109/TNS.2019.2951996

Title: Thermal neutron-induced single-event upsets in microcontrollers containing boron-10

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Authors:

Auden, Elizabeth C. ^[1]; Quinn, Heather M. ^[1]; Wender, Stephen A. ^[1]; O'Donnell, John M. ^[1]; Lisowski, Paul W. ^[1]; George, Jeffrey S. ^[1]; Xu, Ning ^[1]; Black, Dolores A. ^[2]; Black, Jeffrey D. ^[2]

Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Publication Date:: 2019-11-06

Research Org.:: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Sponsoring Org.:: USDOE National Nuclear Security Administration (NNSA)

OSTI Identifier:: 1574802

Alternate Identifier(s):: OSTI ID: 1608680

Report Number(s):: SAND2019-7606J; LA-UR-19-26094
Journal ID: ISSN 0018-9499; 677058; TRN: US2001204

Grant/Contract Number:: AC04-94AL85000; 89233218CNA000001

Resource Type:: Accepted Manuscript

Journal Name:: IEEE Transactions on Nuclear Science

Additional Journal Information:: Journal Volume: 67; Journal Issue: 1; Conference: Nuclear and Space Radiation Effects Conference (NSREC) ; 2019-07-08 - 2019-07-12 ;; Journal ID: ISSN 0018-9499

Publisher:: IEEE

Country of Publication:: United States

Language:: English

Subject:: 73 NUCLEAR PHYSICS AND RADIATION PHYSICS; microcontrollers; neutron; radiation effects; semiconductor device doping; semiconductor device modeling; single event effects; SRAM cells

Citation Formats


                    Auden, Elizabeth C., Quinn, Heather M., Wender, Stephen A., O'Donnell, John M., Lisowski, Paul W., George, Jeffrey S., Xu, Ning, Black, Dolores A., and Black, Jeffrey D. Thermal neutron-induced single-event upsets in microcontrollers containing boron-10.  United States: N. p., 2019. 
        Web.  doi:10.1109/TNS.2019.2951996.

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                    Auden, Elizabeth C., Quinn, Heather M., Wender, Stephen A., O'Donnell, John M., Lisowski, Paul W., George, Jeffrey S., Xu, Ning, Black, Dolores A., & Black, Jeffrey D. Thermal neutron-induced single-event upsets in microcontrollers containing boron-10.  United States.  doi:10.1109/TNS.2019.2951996.

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                    Auden, Elizabeth C., Quinn, Heather M., Wender, Stephen A., O'Donnell, John M., Lisowski, Paul W., George, Jeffrey S., Xu, Ning, Black, Dolores A., and Black, Jeffrey D. Wed .  
        "Thermal neutron-induced single-event upsets in microcontrollers containing boron-10".  United States.  doi:10.1109/TNS.2019.2951996.  https://www.osti.gov/servlets/purl/1574802.

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@article{osti_1574802,

  title        = {Thermal neutron-induced single-event upsets in microcontrollers containing boron-10},

  author       = {Auden, Elizabeth C. and Quinn, Heather M. and Wender, Stephen A. and O'Donnell, John M. and Lisowski, Paul W. and George, Jeffrey S. and Xu, Ning and Black, Dolores A. and Black, Jeffrey D.},

  abstractNote = {},

  doi          = {10.1109/TNS.2019.2951996},

  journal      = {IEEE Transactions on Nuclear Science},

  number       = 1,

  volume       = 67,

  place        = {United States},

  year         = {2019},

  month        = {11}

}

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DOI: 10.1109/TNS.2019.2951996

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