Spatial DIC Errors due to Pattern-Induced Bias and Grey Level Discretization
Abstract
Digital image correlation (DIC) is an optical metrology method widely used in experimental mechanics for full-field shape, displacement and strain measurements. The required strain resolution for engineering applications of interest mandates DIC to have a high image displacement matching accuracy, on the order of 1/100th of a pixel, which necessitates an understanding of DIC errors. In this paper, we examine two spatial bias terms that have been almost completely overlooked. They cause a persistent offset in the matching of image intensities and thus corrupt DIC results. We name them pattern-induced bias (PIB), and intensity discretization bias (IDB). We show that the PIB error occurs in the presence of an undermatched shape function and is primarily dictated by the underlying intensity pattern for a fixed displacement field and DIC settings. The IDB error is due to the quantization of the gray level intensity values in the digital camera. In this paper we demonstrate these errors and quantify their magnitudes both experimentally and with synthetic images.
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1574475
- Report Number(s):
- SAND-2019-13784J
Journal ID: ISSN 0014-4851; 681363
- Grant/Contract Number:
- AC04-94AL85000; NA0003525
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Experimental Mechanics
- Additional Journal Information:
- Journal Volume: 60; Journal ID: ISSN 0014-4851
- Publisher:
- Springer
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; Digital image correlation; Pattern induced bias; Intensity discretization bias; Pattern induced errors; Uncertainty quantification
Citation Formats
Fayad, S. S., Seidl, D. T., and Reu, P. L. Spatial DIC Errors due to Pattern-Induced Bias and Grey Level Discretization. United States: N. p., 2019.
Web. doi:10.1007/s11340-019-00553-9.
Fayad, S. S., Seidl, D. T., & Reu, P. L. Spatial DIC Errors due to Pattern-Induced Bias and Grey Level Discretization. United States. https://doi.org/10.1007/s11340-019-00553-9
Fayad, S. S., Seidl, D. T., and Reu, P. L. Thu .
"Spatial DIC Errors due to Pattern-Induced Bias and Grey Level Discretization". United States. https://doi.org/10.1007/s11340-019-00553-9. https://www.osti.gov/servlets/purl/1574475.
@article{osti_1574475,
title = {Spatial DIC Errors due to Pattern-Induced Bias and Grey Level Discretization},
author = {Fayad, S. S. and Seidl, D. T. and Reu, P. L.},
abstractNote = {Digital image correlation (DIC) is an optical metrology method widely used in experimental mechanics for full-field shape, displacement and strain measurements. The required strain resolution for engineering applications of interest mandates DIC to have a high image displacement matching accuracy, on the order of 1/100th of a pixel, which necessitates an understanding of DIC errors. In this paper, we examine two spatial bias terms that have been almost completely overlooked. They cause a persistent offset in the matching of image intensities and thus corrupt DIC results. We name them pattern-induced bias (PIB), and intensity discretization bias (IDB). We show that the PIB error occurs in the presence of an undermatched shape function and is primarily dictated by the underlying intensity pattern for a fixed displacement field and DIC settings. The IDB error is due to the quantization of the gray level intensity values in the digital camera. In this paper we demonstrate these errors and quantify their magnitudes both experimentally and with synthetic images.},
doi = {10.1007/s11340-019-00553-9},
journal = {Experimental Mechanics},
number = ,
volume = 60,
place = {United States},
year = {Thu Nov 07 00:00:00 EST 2019},
month = {Thu Nov 07 00:00:00 EST 2019}
}
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Works referencing / citing this record:
On the Optimal Pattern for Displacement Field Measurement: Random Speckle and DIC, or Checkerboard and LSA?
journal, January 2020
- Grédiac, M.; Blaysat, B.; Sur, F.
- Experimental Mechanics, Vol. 60, Issue 4