skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

Abstract

X-ray beam induced current (XBIC) measurements allow mapping of the nanoscale performance of electronic devices such as solar cells. Ideally, XBIC is employed simultaneously with other techniques within a multi-modal X-ray microscopy approach. An example is given herein combining XBIC with X-ray fluorescence to enable point-by-point correlations of the electrical performance with chemical composition. For the highest signal-to-noise ratio in XBIC measurements, lock-in amplification plays a crucial role. By this approach, the X-ray beam is modulated by an optical chopper upstream of the sample. The modulated X-ray beam induced electrical signal is amplified and demodulated to the chopper frequency using a lock-in amplifier. By optimizing low-pass filter settings, modulation frequency, and amplification amplitudes, noise can efficiently be suppressed for the extraction of a clear XBIC signal. A similar setup can be used to measure the X-ray beam induced voltage (XBIV). Beyond standard XBIC/XBIV measurements, XBIC can be measured with bias light or bias voltage applied such that outdoor working conditions of solar cells can be reproduced during in-situ and operando measurements. Ultimately, the multi-modal and multi-dimensional evaluation of electronic devices at the nanoscale enables new insights into the complex dependencies between composition, structure, and performance, which is an important stepmore » towards solving the materials' paradigm.« less

Authors:
 [1];  [2];  [2];  [2];  [3];  [1];  [3]
  1. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. Hamburg, Hamburg (Germany). Dept. Physik
  2. Arizona State Univ., Tempe, AZ (United States). School of Electrical, Computer and Energy Engineering
  3. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Publication Date:
Research Org.:
Arizona State Univ., Tempe, AZ (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1574177
Grant/Contract Number:  
[EE0008163]
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Visualized Experiments
Additional Journal Information:
[ Journal Issue: 150]; Journal ID: ISSN 1940-087X
Publisher:
MyJoVE Corp.
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY

Citation Formats

Ossig, Christina, Nietzold, Tara, West, Bradley, Bertoni, Mariana, Falkenberg, Gerald, Schroer, Christian G., and Stuckelberger, Michael E. X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells. United States: N. p., 2019. Web. doi:10.3791/60001.
Ossig, Christina, Nietzold, Tara, West, Bradley, Bertoni, Mariana, Falkenberg, Gerald, Schroer, Christian G., & Stuckelberger, Michael E. X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells. United States. doi:10.3791/60001.
Ossig, Christina, Nietzold, Tara, West, Bradley, Bertoni, Mariana, Falkenberg, Gerald, Schroer, Christian G., and Stuckelberger, Michael E. Tue . "X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells". United States. doi:10.3791/60001. https://www.osti.gov/servlets/purl/1574177.
@article{osti_1574177,
title = {X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells},
author = {Ossig, Christina and Nietzold, Tara and West, Bradley and Bertoni, Mariana and Falkenberg, Gerald and Schroer, Christian G. and Stuckelberger, Michael E.},
abstractNote = {X-ray beam induced current (XBIC) measurements allow mapping of the nanoscale performance of electronic devices such as solar cells. Ideally, XBIC is employed simultaneously with other techniques within a multi-modal X-ray microscopy approach. An example is given herein combining XBIC with X-ray fluorescence to enable point-by-point correlations of the electrical performance with chemical composition. For the highest signal-to-noise ratio in XBIC measurements, lock-in amplification plays a crucial role. By this approach, the X-ray beam is modulated by an optical chopper upstream of the sample. The modulated X-ray beam induced electrical signal is amplified and demodulated to the chopper frequency using a lock-in amplifier. By optimizing low-pass filter settings, modulation frequency, and amplification amplitudes, noise can efficiently be suppressed for the extraction of a clear XBIC signal. A similar setup can be used to measure the X-ray beam induced voltage (XBIV). Beyond standard XBIC/XBIV measurements, XBIC can be measured with bias light or bias voltage applied such that outdoor working conditions of solar cells can be reproduced during in-situ and operando measurements. Ultimately, the multi-modal and multi-dimensional evaluation of electronic devices at the nanoscale enables new insights into the complex dependencies between composition, structure, and performance, which is an important step towards solving the materials' paradigm.},
doi = {10.3791/60001},
journal = {Journal of Visualized Experiments},
number = [150],
volume = ,
place = {United States},
year = {2019},
month = {8}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 1 work
Citation information provided by
Web of Science

Save / Share:

Works referencing / citing this record:

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
text, January 2019

  • Ossig, Christina; Nietzold, Tara; West, Bradley
  • Deutsches Elektronen-Synchrotron, DESY, Hamburg
  • DOI: 10.3204/pubdb-2019-03148