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Title: Electron beam-induced current imaging with two-angstrom resolution

Authors:
; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1574049
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Name: Ultramicroscopy Journal Volume: 207 Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Mecklenburg, Matthew, Hubbard, William A., Lodico, Jared J., and Regan, B. C. Electron beam-induced current imaging with two-angstrom resolution. Netherlands: N. p., 2019. Web. doi:10.1016/j.ultramic.2019.112852.
Mecklenburg, Matthew, Hubbard, William A., Lodico, Jared J., & Regan, B. C. Electron beam-induced current imaging with two-angstrom resolution. Netherlands. https://doi.org/10.1016/j.ultramic.2019.112852
Mecklenburg, Matthew, Hubbard, William A., Lodico, Jared J., and Regan, B. C. Sun . "Electron beam-induced current imaging with two-angstrom resolution". Netherlands. https://doi.org/10.1016/j.ultramic.2019.112852.
@article{osti_1574049,
title = {Electron beam-induced current imaging with two-angstrom resolution},
author = {Mecklenburg, Matthew and Hubbard, William A. and Lodico, Jared J. and Regan, B. C.},
abstractNote = {},
doi = {10.1016/j.ultramic.2019.112852},
journal = {Ultramicroscopy},
number = C,
volume = 207,
place = {Netherlands},
year = {2019},
month = {12}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.ultramic.2019.112852

Citation Metrics:
Cited by: 11 works
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