Electron beam-induced current imaging with two-angstrom resolution

Mecklenburg, Matthew; Hubbard, William A.; Lodico, Jared J.; Regan, B. C.

doi:10.1016/j.ultramic.2019.112852

Title: Electron beam-induced current imaging with two-angstrom resolution

Journal Article · 01 December 2019 · Ultramicroscopy

DOI: https://doi.org/10.1016/j.ultramic.2019.112852 · OSTI ID:1574049

Mecklenburg, Matthew; Hubbard, William A.; Lodico, Jared J.; Regan, B. C.

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Sponsoring Organization:: USDOE

OSTI ID:: 1574049

Journal Information:: Ultramicroscopy, Journal Name: Ultramicroscopy Journal Issue: C Vol. 207; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: Netherlands

Language:: English

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High-angle ADF and high-resolution SE imaging of supported catalyst clusters Liu, J.; Cowley, J. M. Ultramicroscopy, Vol. 34, Issue 1-2 https://doi.org/10.1016/0304-3991(90)90066-U	journal	November 1990
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Imaging single atoms using secondary electrons with an aberration-corrected electron microscope Zhu, Y.; Inada, H.; Nakamura, K. Nature Materials, Vol. 8, Issue 10 https://doi.org/10.1038/nmat2532	journal	September 2009
Simple calculation of energy distribution of low‐energy secondary electrons emitted from metals under electron bombardment Chung, M. S.; Everhart, T. E. Journal of Applied Physics, Vol. 45, Issue 2 https://doi.org/10.1063/1.1663306	journal	February 1974
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Wide-band detector for micro-microampere low-energy electron currents Everhart, T. E.; Thornley, R. F. M. Journal of Scientific Instruments, Vol. 37, Issue 7 https://doi.org/10.1088/0950-7671/37/7/307	journal	July 1960
STEM Imaging with Beam-Induced Hole and Secondary Electron Currents Hubbard, William A.; Mecklenburg, Matthew; Chan, Ho Leung Physical Review Applied, Vol. 10, Issue 4 https://doi.org/10.1103/PhysRevApplied.10.044066	journal	October 2018
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Two-Dimensional Mapping of Chemical Information at Atomic Resolution Bosman, M.; Keast, V. J.; García-Muñoz, J. L. Physical Review Letters, Vol. 99, Issue 8 https://doi.org/10.1103/PhysRevLett.99.086102	journal	August 2007
Recent developments in secondary electron imaging Howie, A. Journal of Microscopy, Vol. 180, Issue 3 https://doi.org/10.1111/j.1365-2818.1995.tb03678.x	journal	December 1995
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy Muller, D. A.; Kourkoutis, L. F.; Murfitt, M. Science, Vol. 319, Issue 5866 https://doi.org/10.1126/science.1148820	journal	February 2008
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