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Title: Diffraction paradox: An unusually broad diffraction background marks high quality graphene

Journal Article · · Physical Review B
 [1];  [2];  [3];  [1]
  1. Ames Lab., Ames, IA (United States); Iowa State Univ., Ames, IA (United States). Dept. of Physics and Astronomy
  2. Univ. of Duisburg-Essen, Duisburg (Germany). Dept. of Physics, and Center for Nanointegration (CENIDE)
  3. Ames Lab., Ames, IA (United States); Iowa State Univ., Ames, IA (United States). Dept. of Chemistry

The realization of the unusual properties of two-dimensional (2D) materials requires the formation of large domains of single-layer thickness, extending over the mesoscale. It is found that the formation of uniform graphene on SiC, contrary to textbook diffraction, is signaled by a strong bell-shaped component (BSC) around the (00) and G(10) spots (but not around the substrate spots). The BCS is also seen on graphene grown on metals, because a single uniform graphene layer can be also grown with large lateral size. It is only seen by electron diffraction but not with x-ray or He scattering. Although the origin of such an intriguing result is unclear, its presence in the earlier literature (but never mentioned) points to its robustness and significance. A likely mechanism relates to the the spatial confinement of the graphene electrons, within a single layer. Finally, this leads to large spread in their wave vector which is transferred by electron-electron interactions to the elastically scattered electrons to generate the BSC.

Research Organization:
Ames Laboratory (AMES), Ames, IA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
Grant/Contract Number:
AC02-07CH11358; SFB1242
OSTI ID:
1574018
Alternate ID(s):
OSTI ID: 1573291
Report Number(s):
IS-J 10074; PRBMDO; TRN: US2100044
Journal Information:
Physical Review B, Vol. 100, Issue 15; ISSN 2469-9950
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 11 works
Citation information provided by
Web of Science

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Figures / Tables (6)