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Title: Passivation, conductivity, and selectivity in solar cell contacts: Concepts and simulations based on a unified partial-resistances framework

Authors:
ORCiD logo [1]; ORCiD logo [1];  [2]; ORCiD logo [3]; ORCiD logo [1]
  1. School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, Arizona 85287, USA
  2. Intel Corporation, 3585 SW 198th Avenue, Aloha, Oregon 97007, USA
  3. Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Institute of Microengineering (IMT), Ecole Polytechnique Fédérale de Lausanne (EPFL), Neuchâtel 2002, Switzerland
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1573869
Grant/Contract Number:  
EE0007552; EE0008552; EE00081567; EE00006335
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Name: Journal of Applied Physics Journal Volume: 126 Journal Issue: 18; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Onno, Arthur, Chen, Christopher, Koswatta, Priyaranga, Boccard, Mathieu, and Holman, Zachary C. Passivation, conductivity, and selectivity in solar cell contacts: Concepts and simulations based on a unified partial-resistances framework. United States: N. p., 2019. Web. doi:10.1063/1.5117201.
Onno, Arthur, Chen, Christopher, Koswatta, Priyaranga, Boccard, Mathieu, & Holman, Zachary C. Passivation, conductivity, and selectivity in solar cell contacts: Concepts and simulations based on a unified partial-resistances framework. United States. doi:10.1063/1.5117201.
Onno, Arthur, Chen, Christopher, Koswatta, Priyaranga, Boccard, Mathieu, and Holman, Zachary C. Thu . "Passivation, conductivity, and selectivity in solar cell contacts: Concepts and simulations based on a unified partial-resistances framework". United States. doi:10.1063/1.5117201.
@article{osti_1573869,
title = {Passivation, conductivity, and selectivity in solar cell contacts: Concepts and simulations based on a unified partial-resistances framework},
author = {Onno, Arthur and Chen, Christopher and Koswatta, Priyaranga and Boccard, Mathieu and Holman, Zachary C.},
abstractNote = {},
doi = {10.1063/1.5117201},
journal = {Journal of Applied Physics},
number = 18,
volume = 126,
place = {United States},
year = {2019},
month = {11}
}

Journal Article:
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