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Title: Unraveling the Voltage Decay Phenomenon in Li-Rich Layered Oxide Cathode of No Oxygen Activity

Abstract

Abstract Extensive efforts have been devoted to unraveling the true cause of voltage decay in Li, Mn‐rich layered oxides. An initial consensus was reached on structural rearrangement, then leaned toward the newly discovered lattice oxygen activity. It is challenging to differentiate their explicit roles because these events typically coexist during the electrochemical reaction of most Li‐rich layered oxides. Here, the voltage decay behavior is probed in Li 1.2 Ni 0.2 Ru 0.6 O 2 , a structurally and electrochemically relevant compound to Li, Mn‐rich layered oxide, but of no oxygen activity. Such intriguing characteristics allow the explicit decoupling of the contribution of transition metal migration and lattice oxygen activity to voltage decay in Li‐rich layered oxides. The results demonstrate that the microstructural evolution, mainly originating from transition metal migration, is a direct cause of voltage decay, and lattice oxygen activity likely accelerates the decay.

Authors:
 [1];  [2];  [1];  [1];  [1];  [2]; ORCiD logo [1]
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  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Energy Storage and Distributed Resources Div.
  2. Brookhaven National Lab. (BNL), Upton, NY (United States). Center for Functional Nanomaterials
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1574426
Alternate Identifier(s):
OSTI ID: 1573283
Report Number(s):
BNL-212335-2019-JAAM
Journal ID: ISSN 1614-6832
Grant/Contract Number:  
SC0012704; DE‐AC02‐05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Advanced Energy Materials
Additional Journal Information:
Journal Volume: 9; Journal Issue: 47; Journal ID: ISSN 1614-6832
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
25 ENERGY STORAGE; Li‐ion battery cathodes; Li‐rich layered oxide; oxygen activity; transition metal migration; voltage decay

Citation Formats

Li, Ning, Hwang, Sooyeon, Sun, Meiling, Fu, Yanbao, Battaglia, Vincent S., Su, Dong, and Tong, Wei. Unraveling the Voltage Decay Phenomenon in Li-Rich Layered Oxide Cathode of No Oxygen Activity. United States: N. p., 2019. Web. doi:10.1002/aenm.201902258.
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Li, Ning, Hwang, Sooyeon, Sun, Meiling, Fu, Yanbao, Battaglia, Vincent S., Su, Dong, & Tong, Wei. Unraveling the Voltage Decay Phenomenon in Li-Rich Layered Oxide Cathode of No Oxygen Activity. United States. https://doi.org/10.1002/aenm.201902258
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Li, Ning, Hwang, Sooyeon, Sun, Meiling, Fu, Yanbao, Battaglia, Vincent S., Su, Dong, and Tong, Wei. Wed . "Unraveling the Voltage Decay Phenomenon in Li-Rich Layered Oxide Cathode of No Oxygen Activity". United States. https://doi.org/10.1002/aenm.201902258. https://www.osti.gov/servlets/purl/1574426.
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@article{osti_1574426,
title = {Unraveling the Voltage Decay Phenomenon in Li-Rich Layered Oxide Cathode of No Oxygen Activity},
author = {Li, Ning and Hwang, Sooyeon and Sun, Meiling and Fu, Yanbao and Battaglia, Vincent S. and Su, Dong and Tong, Wei},
abstractNote = {Abstract Extensive efforts have been devoted to unraveling the true cause of voltage decay in Li, Mn‐rich layered oxides. An initial consensus was reached on structural rearrangement, then leaned toward the newly discovered lattice oxygen activity. It is challenging to differentiate their explicit roles because these events typically coexist during the electrochemical reaction of most Li‐rich layered oxides. Here, the voltage decay behavior is probed in Li 1.2 Ni 0.2 Ru 0.6 O 2 , a structurally and electrochemically relevant compound to Li, Mn‐rich layered oxide, but of no oxygen activity. Such intriguing characteristics allow the explicit decoupling of the contribution of transition metal migration and lattice oxygen activity to voltage decay in Li‐rich layered oxides. The results demonstrate that the microstructural evolution, mainly originating from transition metal migration, is a direct cause of voltage decay, and lattice oxygen activity likely accelerates the decay.},
doi = {10.1002/aenm.201902258},
journal = {Advanced Energy Materials},
number = 47,
volume = 9,
place = {United States},
year = {Wed Nov 06 00:00:00 EST 2019},
month = {Wed Nov 06 00:00:00 EST 2019}
}
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https://doi.org/10.1002/aenm.201902258
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