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Title: A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography

Abstract

Electron tomography is used in both materials science and structural biology to image features well below the optical resolution limit. Here, we present a new method for high-resolution 3D transmission electron microscopy (TEM) which approximately reconstructs the electrostatic potential of a sample at atomic resolution in all three dimensions. We use phase contrast images captured through-focus and at varying tilt angles, along with an implicit phase retrieval algorithm that accounts for dynamical and strong scattering, providing more accurate results with much lower electron doses than current atomic electron tomography methods. We test our algorithm using simulated images of a synthetic needle geometry dataset composed of an amorphous silicon dioxide shell around a silicon core. By simulating various levels of electron dose, tilt and defocus, missing projections, and regularization methods, we identify a configuration that allows us to accurately determine both atomic positions and species. We also test the ability of our method to recover randomly positioned vacancies in light elements such as silicon, and to accurately reconstruct strongly-scattering elements such as tungsten.

Authors:
; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES), Chemical Sciences, Geosciences & Biosciences Division; National Science Foundation (NSF)
OSTI Identifier:
1573259
Alternate Identifier(s):
OSTI ID: 1760197
Grant/Contract Number:  
AC02-05CH11231; DMR1548924
Resource Type:
Published Article
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Name: Ultramicroscopy Journal Volume: 208 Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English
Subject:
42 ENGINEERING; Transmission electron microscopy; phase retrieval; multiple scattering; optimization; atomic electron tomography

Citation Formats

Ren, David, Ophus, Colin, Chen, Michael, and Waller, Laura. A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography. Netherlands: N. p., 2020. Web. doi:10.1016/j.ultramic.2019.112860.
Ren, David, Ophus, Colin, Chen, Michael, & Waller, Laura. A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography. Netherlands. doi:10.1016/j.ultramic.2019.112860.
Ren, David, Ophus, Colin, Chen, Michael, and Waller, Laura. Wed . "A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography". Netherlands. doi:10.1016/j.ultramic.2019.112860.
@article{osti_1573259,
title = {A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography},
author = {Ren, David and Ophus, Colin and Chen, Michael and Waller, Laura},
abstractNote = {Electron tomography is used in both materials science and structural biology to image features well below the optical resolution limit. Here, we present a new method for high-resolution 3D transmission electron microscopy (TEM) which approximately reconstructs the electrostatic potential of a sample at atomic resolution in all three dimensions. We use phase contrast images captured through-focus and at varying tilt angles, along with an implicit phase retrieval algorithm that accounts for dynamical and strong scattering, providing more accurate results with much lower electron doses than current atomic electron tomography methods. We test our algorithm using simulated images of a synthetic needle geometry dataset composed of an amorphous silicon dioxide shell around a silicon core. By simulating various levels of electron dose, tilt and defocus, missing projections, and regularization methods, we identify a configuration that allows us to accurately determine both atomic positions and species. We also test the ability of our method to recover randomly positioned vacancies in light elements such as silicon, and to accurately reconstruct strongly-scattering elements such as tungsten.},
doi = {10.1016/j.ultramic.2019.112860},
journal = {Ultramicroscopy},
number = C,
volume = 208,
place = {Netherlands},
year = {2020},
month = {1}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.ultramic.2019.112860

Citation Metrics:
Cited by: 2 works
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