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Title: Trap-Assisted Charge Injection into Large Bandgap Polymer Semiconductors

Abstract

The trap-assisted charge injection in polyfluorene-poly(3,4-ethylenedioxythiophene): poly(styrenesulfonate) (PEDOT:PSS) model systems with an Al or Al/LiF cathode is investigated. We find that inserting 1.3 nm LiF increases electron and hole injections simultaneously and the increase of holes is greater than electrons. The evolution of internal interfaces within polymer light-emitting diodes is observed by transmission electron microscopy, which reveals that the introduction of LiF improves the interface stability at both the cathode (cathode/polymer) and the anode (indium tin oxide (ITO)/PEDOT:PSS). Above-mentioned experimental results have been compared to the numerical simulations with a revised Davids model and potential physical mechanisms for the trap-assisted charge injection are discussed.

Authors:
 [1];  [2];  [3];  [1];  [4];  [5]; ORCiD logo [6];  [7];  [2]; ORCiD logo [8];  [3]
+ Show Author Affiliations
  1. Beijing Inst. of Graphic Communication, Beijing (China); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  2. Univ. of California, Berkeley, CA (United States)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  4. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Beijing Inst. of Technology, Beijing (China)
  5. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); South China Univ. of Technology. Guangzhou (China)
  6. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Xi'an Jiaotong Univ., Xi'an (China)
  7. Beijing Inst. of Graphic Communication, Beijing (China)
  8. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1572036
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Materials
Additional Journal Information:
Journal Volume: 12; Journal Issue: 15; Journal ID: ISSN 1996-1944
Publisher:
MDPI
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; charge injection; trap; interface stability; polymer light-emitting diodes

Citation Formats

Wang, Dongdong, Fina, Michael, Kim, Suhan, Zhang, Chunmei, Zhang, Ting, Deng, Yonghong, Chen, Kai, Liang, Lijuan, Mao, Samuel S., Minor, Andrew M., and Liu, Gao. Trap-Assisted Charge Injection into Large Bandgap Polymer Semiconductors. United States: N. p., 2019. Web. doi:10.3390/ma12152427.
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Wang, Dongdong, Fina, Michael, Kim, Suhan, Zhang, Chunmei, Zhang, Ting, Deng, Yonghong, Chen, Kai, Liang, Lijuan, Mao, Samuel S., Minor, Andrew M., & Liu, Gao. Trap-Assisted Charge Injection into Large Bandgap Polymer Semiconductors. United States. doi:10.3390/ma12152427.
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Wang, Dongdong, Fina, Michael, Kim, Suhan, Zhang, Chunmei, Zhang, Ting, Deng, Yonghong, Chen, Kai, Liang, Lijuan, Mao, Samuel S., Minor, Andrew M., and Liu, Gao. Tue . "Trap-Assisted Charge Injection into Large Bandgap Polymer Semiconductors". United States. doi:10.3390/ma12152427. https://www.osti.gov/servlets/purl/1572036.
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@article{osti_1572036,
title = {Trap-Assisted Charge Injection into Large Bandgap Polymer Semiconductors},
author = {Wang, Dongdong and Fina, Michael and Kim, Suhan and Zhang, Chunmei and Zhang, Ting and Deng, Yonghong and Chen, Kai and Liang, Lijuan and Mao, Samuel S. and Minor, Andrew M. and Liu, Gao},
abstractNote = {The trap-assisted charge injection in polyfluorene-poly(3,4-ethylenedioxythiophene): poly(styrenesulfonate) (PEDOT:PSS) model systems with an Al or Al/LiF cathode is investigated. We find that inserting 1.3 nm LiF increases electron and hole injections simultaneously and the increase of holes is greater than electrons. The evolution of internal interfaces within polymer light-emitting diodes is observed by transmission electron microscopy, which reveals that the introduction of LiF improves the interface stability at both the cathode (cathode/polymer) and the anode (indium tin oxide (ITO)/PEDOT:PSS). Above-mentioned experimental results have been compared to the numerical simulations with a revised Davids model and potential physical mechanisms for the trap-assisted charge injection are discussed.},
doi = {10.3390/ma12152427},
journal = {Materials},
number = 15,
volume = 12,
place = {United States},
year = {2019},
month = {7}
}
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DOI:  10.3390/ma12152427
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