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Title: Ultrafast X-ray Diffraction Study of Melt-front Dynamics in Polycrystalline Thin Films

Journal Article · · Science Advances

Melting is a basic process of matter still not fully understood at the microscopic level. In this work, we use time-resolved X-ray diffraction to examine the ultrafast melting of polycrystalline gold thin films using an optical laser pump followed by a delayed hard Xray probe pulse. We validate the formation of an intermediate new diffraction peak, which we attribute to material trapped between the solid and melted states, that forms 50ps after laser excitation and persists beyond 500ps. The peak width grows rapidly for 50ps, then narrows distinctly at longer timescales. We attribute this to a melting band originating from the grain boundaries and propagating into the grains. Our observation of this intermediate state has implications for the use of ultrafast lasers for ablation during pulsed laser deposition.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
Grant/Contract Number:
SC0012704
OSTI ID:
1570668
Report Number(s):
BNL-212187-2019-JAAM
Journal Information:
Science Advances, Vol. 6, Issue 3; ISSN 2375-2548
Publisher:
AAASCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 17 works
Citation information provided by
Web of Science

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