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Title: Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials

Authors:
 [1];  [1];  [1]; ORCiD logo [1]
  1. Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1570539
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Angewandte Chemie
Additional Journal Information:
Journal Name: Angewandte Chemie Journal Volume: 132 Journal Issue: 4; Journal ID: ISSN 0044-8249
Publisher:
Wiley Blackwell (John Wiley & Sons)
Country of Publication:
Germany
Language:
English

Citation Formats

Zachman, Michael J., Hachtel, Jordan A., Idrobo, Juan Carlos, and Chi, Miaofang. Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials. Germany: N. p., 2019. Web. doi:10.1002/ange.201902993.
Zachman, Michael J., Hachtel, Jordan A., Idrobo, Juan Carlos, & Chi, Miaofang. Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials. Germany. doi:10.1002/ange.201902993.
Zachman, Michael J., Hachtel, Jordan A., Idrobo, Juan Carlos, and Chi, Miaofang. Wed . "Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials". Germany. doi:10.1002/ange.201902993.
@article{osti_1570539,
title = {Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials},
author = {Zachman, Michael J. and Hachtel, Jordan A. and Idrobo, Juan Carlos and Chi, Miaofang},
abstractNote = {},
doi = {10.1002/ange.201902993},
journal = {Angewandte Chemie},
number = 4,
volume = 132,
place = {Germany},
year = {2019},
month = {10}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1002/ange.201902993

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