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Title: Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials

Authors:
 [1];  [1];  [1]; ORCiD logo [1]
  1. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN 37831 USA
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1570538
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Angewandte Chemie (International Edition)
Additional Journal Information:
Journal Name: Angewandte Chemie (International Edition); Journal ID: ISSN 1433-7851
Publisher:
Wiley Blackwell (John Wiley & Sons)
Country of Publication:
Germany
Language:
English

Citation Formats

Zachman, Michael J., Hachtel, Jordan A., Idrobo, Juan Carlos, and Chi, Miaofang. Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials. Germany: N. p., 2019. Web. doi:10.1002/anie.201902993.
Zachman, Michael J., Hachtel, Jordan A., Idrobo, Juan Carlos, & Chi, Miaofang. Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials. Germany. doi:10.1002/anie.201902993.
Zachman, Michael J., Hachtel, Jordan A., Idrobo, Juan Carlos, and Chi, Miaofang. Wed . "Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials". Germany. doi:10.1002/anie.201902993.
@article{osti_1570538,
title = {Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials},
author = {Zachman, Michael J. and Hachtel, Jordan A. and Idrobo, Juan Carlos and Chi, Miaofang},
abstractNote = {},
doi = {10.1002/anie.201902993},
journal = {Angewandte Chemie (International Edition)},
number = ,
volume = ,
place = {Germany},
year = {2019},
month = {10}
}

Journal Article:
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This content will become publicly available on October 15, 2020
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Works referenced in this record:

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