Reaction: Freezing Electrochemical Interfaces for Robustness in Electron Microscopy
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Argonne National Lab. (ANL), Argonne, IL (United States); Univ. of Illinois, Chicago, IL (United States)
In this Issue of Chem, Li and Cui from Stanford University discuss the application of Cryogenicelectron microscopy (Cryo-EM) in the study of battery materials that are generally not robust enough to be explored by conventional TEM. Although Cryo-EM has been applied in structural biology for decades and enabled the atomic visualization of life’s complex machineries, surprisingly, the success of its application in beam-sensitive battery materials was reported just recently in 2017. Ever since then, the mysterious structural details of beam-sensitive battery components are being revealed with profound nanoscale and atomic scale findings. Yet, among the several related reports published within the past year, it is noted that they are currently limited to the interfacial sciences between the Li metal anode and organic liquid electrolyte, namely the solid electrolyte interphase (SEI). Beyond that, we should also bear in mind the existence of many other interfacial problems plaguing the battery community by exhibiting similar electron beam-sensitive features, such as the cathode electrolyte interphase (CEI), and the interfaces in lithium-sulfur battery (Li-S) and lithium-oxygen battery (Li-O2).
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Vehicle Technologies Office (EE-3V); USDOE
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1570068
- Alternate ID(s):
- OSTI ID: 1559292
- Journal Information:
- Chem, Vol. 4, Issue 10; ISSN 2451-9294
- Publisher:
- Cell Press, ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
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