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Title: A Survey of Transparent Conducting Films and Optoelectrical Materials for High Optical Power Applications

Abstract

The lifetime laser damage performance of a wide range of transparent conductive materials is assessed, including ultrathin metal films, doped metal oxides, doped compound semiconductors, and graphene whose carrier densities span five orders of magnitude from 10 18 to 10 23cm -3. Lifetime laser damage thresholds are determined by exposing material surfaces to repeated nanosecond laser pulses at near IR wavelengths (1064 nm). Near threshold fluences, two distinct damage modes, i.e., bulk and discrete, emerge depending on carrier density. These bulk and discrete damage modes are attributed to free carrier-induced bulk and localized, defect-driven absorption processes, respectively. For polycrystalline films with free carrier densities greater than ≈10 20 cm -3, laser damage thresholds are less than 5 J cm -2. In contrast, bulk absorption is not apparent at thresholds substantially higher than ≈10 J cm-2 in single-crystal films with free carrier concentrations lower than ≈10 19cm -3. By increasing thickness, films with lower carrier densities can deliver relevant levels of sheet conductance (<200 Ω sq -1) while remaining transparent. These lifetime laser damage threshold measurements offer systematic criteria to select materials aimed at handling high optical powers in optoelectronics devices and emerging plasmonic and metamaterials for lasers.

Authors:
ORCiD logo [1];  [1];  [1];  [1]; ORCiD logo [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States). Physical and Life Sciences Directorate
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1567993
Alternate Identifier(s):
OSTI ID: 1560759
Report Number(s):
LLNL-JRNL-741079
Journal ID: ISSN 1862-6300; 894755
Grant/Contract Number:  
AC52-07NA27344; 15-ERD-057
Resource Type:
Accepted Manuscript
Journal Name:
Physica Status Solidi. A, Applications and Materials Science
Additional Journal Information:
Journal Volume: na; Journal Issue: na; Journal ID: ISSN 1862-6300
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
Materials science, Lasers

Citation Formats

Yoo, Jae-Hyuck, Lange, Andrew, Chesser, John, Falabella, Steve, and Elhadj, Selim. A Survey of Transparent Conducting Films and Optoelectrical Materials for High Optical Power Applications. United States: N. p., 2019. Web. doi:10.1002/pssa.201900459.
Yoo, Jae-Hyuck, Lange, Andrew, Chesser, John, Falabella, Steve, & Elhadj, Selim. A Survey of Transparent Conducting Films and Optoelectrical Materials for High Optical Power Applications. United States. doi:10.1002/pssa.201900459.
Yoo, Jae-Hyuck, Lange, Andrew, Chesser, John, Falabella, Steve, and Elhadj, Selim. Mon . "A Survey of Transparent Conducting Films and Optoelectrical Materials for High Optical Power Applications". United States. doi:10.1002/pssa.201900459.
@article{osti_1567993,
title = {A Survey of Transparent Conducting Films and Optoelectrical Materials for High Optical Power Applications},
author = {Yoo, Jae-Hyuck and Lange, Andrew and Chesser, John and Falabella, Steve and Elhadj, Selim},
abstractNote = {The lifetime laser damage performance of a wide range of transparent conductive materials is assessed, including ultrathin metal films, doped metal oxides, doped compound semiconductors, and graphene whose carrier densities span five orders of magnitude from 1018 to 1023cm-3. Lifetime laser damage thresholds are determined by exposing material surfaces to repeated nanosecond laser pulses at near IR wavelengths (1064 nm). Near threshold fluences, two distinct damage modes, i.e., bulk and discrete, emerge depending on carrier density. These bulk and discrete damage modes are attributed to free carrier-induced bulk and localized, defect-driven absorption processes, respectively. For polycrystalline films with free carrier densities greater than ≈1020 cm-3, laser damage thresholds are less than 5 J cm-2. In contrast, bulk absorption is not apparent at thresholds substantially higher than ≈10 J cm-2 in single-crystal films with free carrier concentrations lower than ≈1019cm-3. By increasing thickness, films with lower carrier densities can deliver relevant levels of sheet conductance (<200 Ω sq-1) while remaining transparent. These lifetime laser damage threshold measurements offer systematic criteria to select materials aimed at handling high optical powers in optoelectronics devices and emerging plasmonic and metamaterials for lasers.},
doi = {10.1002/pssa.201900459},
journal = {Physica Status Solidi. A, Applications and Materials Science},
number = na,
volume = na,
place = {United States},
year = {2019},
month = {9}
}

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Works referenced in this record:

High mobility transparent conducting oxides for thin film solar cells
journal, January 2010


Unity-Order Index Change in Transparent Conducting Oxides at Visible Frequencies
journal, June 2010

  • Feigenbaum, Eyal; Diest, Kenneth; Atwater, Harry A.
  • Nano Letters, Vol. 10, Issue 6, p. 2111-2116
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