Top quark decay at next-to-leading order in the standard model effective field theory

Boughezal, Radja; Chen, Chien -Yi; Petriello, Frank; Wiegand, Daniel

doi:10.1103/PhysRevD.100.056023

Title: Top quark decay at next-to-leading order in the standard model effective field theory

Journal Article · 30 September 2019 · Physical Review D

DOI: https://doi.org/10.1103/PhysRevD.100.056023 · OSTI ID:1567865

Boughezal, Radja ^[1]; Chen, Chien -Yi ^[2]; Petriello, Frank ^[3];

^[3]

Argonne National Lab. (ANL), Argonne, IL (United States). HEP Div.
Northwestern Univ., Evanston, IL (United States). Dept. of Physics & Astronomy
Argonne National Lab. (ANL), Argonne, IL (United States). HEP Div.; Northwestern Univ., Evanston, IL (United States). Dept. of Physics & Astronomy

We consider top quark decay in the Standard Model Effective Field Theory (SMEFT). We present a calculation of the total decay width and the W-boson helicity fractions at next-to-leading order (NLO) in SMEFT. Our result includes the complete set of contributing four-fermion operators in addition to QCD dipole operators and bottom-mass suppressed effects. We show that operators that first appear at NLO in the SMEFT can be bounded by the current data as well as future data from both a high-luminosity LHC and a potential e⁺e^– collider, demonstrating the importance of going beyond leading order when studying the SMEFT. We discuss technical aspects of our calculation that we believe will be useful in future higher-order studies of the SMEFT, in particular the treatment of γ₅ in loop diagrams.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), High Energy Physics (HEP); National Science Foundation (NSF); USDOE

Grant/Contract Number:: AC02-06CH11357; FG02-91ER40684

OSTI ID:: 1567865

Alternate ID(s):: OSTI ID: 1574364

Journal Information:: Physical Review D, Vol. 100, Issue 5; ISSN 2470-0010

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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