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Title: Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron Probe

Abstract

Here, the projected electrostatic potential of a thick crystal is reconstructed at atomic resolution from experimental scanning transmission electron microscopy data recorded using a new generation fast-readout electron camera. This practical and deterministic inversion of the equations encapsulating multiple scattering that were written down by Bethe in 1928 removes the restriction of established methods to ultrathin (≲50 Å) samples. Instruments already coming on line can overcome the remaining resolution-limiting effects in this approaching due to finite probe-forming aperture size, spatial incoherence, and residual lens aberrations.

Authors:
 [1];  [2];  [1];  [3];  [3];  [4];  [1]
  1. Monash Univ., Melbourne, VIC (Australia)
  2. Monash Univ., Melbourne, VIC (Australia); Cornell Univ., Ithaca, NY (United States)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  4. Univ. of Melbourne (Australia); Forschungszentrum Julich (Germany)
Publication Date:
Research Org.:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
OSTI Identifier:
1567147
Alternate Identifier(s):
OSTI ID: 1488884
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 121; Journal Issue: 26; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Brown, H. G., Chen, Z., Weyland, M., Ophus, C., Ciston, J., Allen, L. J., and Findlay, Scott D. Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron Probe. United States: N. p., 2018. Web. doi:10.1103/physrevlett.121.266102.
Brown, H. G., Chen, Z., Weyland, M., Ophus, C., Ciston, J., Allen, L. J., & Findlay, Scott D. Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron Probe. United States. https://doi.org/10.1103/physrevlett.121.266102
Brown, H. G., Chen, Z., Weyland, M., Ophus, C., Ciston, J., Allen, L. J., and Findlay, Scott D. Wed . "Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron Probe". United States. https://doi.org/10.1103/physrevlett.121.266102. https://www.osti.gov/servlets/purl/1567147.
@article{osti_1567147,
title = {Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron Probe},
author = {Brown, H. G. and Chen, Z. and Weyland, M. and Ophus, C. and Ciston, J. and Allen, L. J. and Findlay, Scott D.},
abstractNote = {Here, the projected electrostatic potential of a thick crystal is reconstructed at atomic resolution from experimental scanning transmission electron microscopy data recorded using a new generation fast-readout electron camera. This practical and deterministic inversion of the equations encapsulating multiple scattering that were written down by Bethe in 1928 removes the restriction of established methods to ultrathin (≲50 Å) samples. Instruments already coming on line can overcome the remaining resolution-limiting effects in this approaching due to finite probe-forming aperture size, spatial incoherence, and residual lens aberrations.},
doi = {10.1103/physrevlett.121.266102},
journal = {Physical Review Letters},
number = 26,
volume = 121,
place = {United States},
year = {Wed Dec 26 00:00:00 EST 2018},
month = {Wed Dec 26 00:00:00 EST 2018}
}

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