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Title: Strain and Electronic Nematicity in La2-xSrxCuO4

Abstract

Electronic nematicity has previously been observed in La2-xSrxCuO4 thin films by the angle resolved transverse resistivity method with a director whose orientation is always pinned to the crystal axes when the film is grown on an orthorhombic substrate but not when the substrate is tetragonal. Here we report on measurements of thin films grown on (tetragonal) LaSrAlO4 and subsequently placed in an apparatus that allows the application of uniaxial compressive strain. The apparatus applied enough force to produce a 1% orthorhombicity in LaSrAlO4 and yet no change in the electronic nematicity was observed in films under strain compared to when they were unstrained.

Authors:
ORCiD logo [1];  [1];  [2];  [1];  [1];  [1];  [2]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States); Yale Univ., New Haven, CT (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1566876
Alternate Identifier(s):
OSTI ID: 1571432
Report Number(s):
BNL-212121-2019-JAAM; BNL-212207-2019-JAAM
Journal ID: ISSN 1557-1939
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Superconductivity and Novel Magnetism
Additional Journal Information:
Journal Volume: 33; Journal Issue: 1; Journal ID: ISSN 1557-1939
Publisher:
Springer
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; Electronic nematicity; Spontaneous symmetry breaking; Strain; Cuprates; High temperature superconductivity; Transverse voltage; Electrical transport

Citation Formats

Bollinger, Anthony T., Wu, Zebin, He, Xi, Drozdov, Ilya, Wu, Jie, Robinson, Ian, and Bozovic, Ivan. Strain and Electronic Nematicity in La2-xSrxCuO4. United States: N. p., 2019. Web. https://doi.org/10.1007/s10948-019-05327-x.
Bollinger, Anthony T., Wu, Zebin, He, Xi, Drozdov, Ilya, Wu, Jie, Robinson, Ian, & Bozovic, Ivan. Strain and Electronic Nematicity in La2-xSrxCuO4. United States. https://doi.org/10.1007/s10948-019-05327-x
Bollinger, Anthony T., Wu, Zebin, He, Xi, Drozdov, Ilya, Wu, Jie, Robinson, Ian, and Bozovic, Ivan. Mon . "Strain and Electronic Nematicity in La2-xSrxCuO4". United States. https://doi.org/10.1007/s10948-019-05327-x. https://www.osti.gov/servlets/purl/1566876.
@article{osti_1566876,
title = {Strain and Electronic Nematicity in La2-xSrxCuO4},
author = {Bollinger, Anthony T. and Wu, Zebin and He, Xi and Drozdov, Ilya and Wu, Jie and Robinson, Ian and Bozovic, Ivan},
abstractNote = {Electronic nematicity has previously been observed in La2-xSrxCuO4 thin films by the angle resolved transverse resistivity method with a director whose orientation is always pinned to the crystal axes when the film is grown on an orthorhombic substrate but not when the substrate is tetragonal. Here we report on measurements of thin films grown on (tetragonal) LaSrAlO4 and subsequently placed in an apparatus that allows the application of uniaxial compressive strain. The apparatus applied enough force to produce a 1% orthorhombicity in LaSrAlO4 and yet no change in the electronic nematicity was observed in films under strain compared to when they were unstrained.},
doi = {10.1007/s10948-019-05327-x},
journal = {Journal of Superconductivity and Novel Magnetism},
number = 1,
volume = 33,
place = {United States},
year = {2019},
month = {9}
}

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