Femtosecond electron spectroscopy in an electron microscope with high brightness beams
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1564485
- Grant/Contract Number:
- FG0206ER46309; 1625181
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Chemical Physics Letters
- Additional Journal Information:
- Journal Name: Chemical Physics Letters Journal Volume: 683 Journal Issue: C; Journal ID: ISSN 0009-2614
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
Zhou, Faran, Williams, Joseph, and Ruan, Chong-Yu. Femtosecond electron spectroscopy in an electron microscope with high brightness beams. Netherlands: N. p., 2017.
Web. doi:10.1016/j.cplett.2017.03.019.
Zhou, Faran, Williams, Joseph, & Ruan, Chong-Yu. Femtosecond electron spectroscopy in an electron microscope with high brightness beams. Netherlands. https://doi.org/10.1016/j.cplett.2017.03.019
Zhou, Faran, Williams, Joseph, and Ruan, Chong-Yu. Fri .
"Femtosecond electron spectroscopy in an electron microscope with high brightness beams". Netherlands. https://doi.org/10.1016/j.cplett.2017.03.019.
@article{osti_1564485,
title = {Femtosecond electron spectroscopy in an electron microscope with high brightness beams},
author = {Zhou, Faran and Williams, Joseph and Ruan, Chong-Yu},
abstractNote = {},
doi = {10.1016/j.cplett.2017.03.019},
journal = {Chemical Physics Letters},
number = C,
volume = 683,
place = {Netherlands},
year = {Fri Sep 01 00:00:00 EDT 2017},
month = {Fri Sep 01 00:00:00 EDT 2017}
}
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.cplett.2017.03.019
https://doi.org/10.1016/j.cplett.2017.03.019
Other availability
Cited by: 9 works
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