A study of the radiation tolerance of poly-crystalline and single-crystalline CVD diamond to 800 MeV and 24 GeV protons

Bäni, L.; Alexopoulos, A.; Artuso, M.; Bachmair, F.; Bartosik, M.; Beck, H.; Bellini, V.; Belyaev, V.; Bentele, B.; Bes, A.; Brom, J-M; Bruzzi, M.; Chiodini, G.; Chren, D.; Cindro, V.; Claus, G.; Collot, J.; Cumalat, J.; Dabrowski, A.; D’Alessandro, R.; Dauvergne, D.; de Boer, W.; Dick, S.; Dorfer, C.; Dünser, M.; Eremin, V.; Forcolin, G.; Forneris, J.; Gallin-Martel, L.; Gallin-Martel, M-L; Gan, K. K.; Gastal, M.; Giroletti, C.; Goffe, M.; Goldstein, J.; Golubev, A.; Gorišek, A.; Grigoriev, E.; Grosse-Knetter, J.; Grummer, A.; Gui, B.; Guthoff, M.; Hiti, B.; Hits, D.; Hoeferkamp, M.; Hofmann, T.; Hosselet, J.; Hostachy, J-Y; Hügging, F.; Hutton, C.; Janssen, J.; Kagan, H.; Kanxheri, K.; Kasieczka, G.; Kass, R.; Kis, M.; Kramberger, G.; Kuleshov, S.; Lacoste, A.; Lagomarsino, S.; Lo Giudice, A.; Paz, I. Lopez; Lukosi, E.; Maazouzi, C.; Mandic, I.; Mathieu, C.; Menichelli, M.; Mikuž, M.; Morozzi, A.; Moss, J.; Mountain, R.; Oh, A.; Olivero, P.; Passeri, D.; Pernegger, H.; Perrino, R.; Piccini, M.; Picollo, F.; Pomorski, M.; Potenza, R.; Quadt, A.; Rarbi, F.; Re, A.; Reichmann, M.; Roe, S.; Becerra, D. A. Sanz; Scaringella, M.; Schaffner, D.; Schmidt, C. J.; Schnetzer, S.; Schioppa, E.; Sciortino, S.; Scorzoni, A.; Seidel, S.; Servoli, L.; Smith, D. S.; Sopko, B.; Sopko, V.; Spagnolo, S.; Spanier, S.; Stenson, K.; Stone, R.; Sutera, C.; Traeger, M.; Trischuk, W.; Truccato, M.; Tuve, C.; Velthuis, J.; Venturi, N.; Wagner, S.; Wallny, R.; Wang, J. C.; Weingarten, J.; Weiss, C.; Wengler, T.; Wermes, N.; Yamouni, M.; Zavrtanik, M.

doi:10.1088/1361-6463/ab37c6

Title: A study of the radiation tolerance of poly-crystalline and single-crystalline CVD diamond to 800 MeV and 24 GeV protons

Journal Article · 30 August 2019 · Journal of Physics. D, Applied Physics

DOI: https://doi.org/10.1088/1361-6463/ab37c6 · OSTI ID:1564370

; Alexopoulos, A.; Artuso, M.;

; Bartosik, M.; Beck, H.; Bellini, V.; Belyaev, V.; Bentele, B.; Bes, A.; Brom, J-M; Bruzzi, M.; Chiodini, G.; Chren, D.; Cindro, V.; Claus, G.; Collot, J.; Cumalat, J.; Dabrowski, A.; D’Alessandro, R. more »

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Sponsoring Organization:: USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)

Grant/Contract Number:: SC0010005; SC0010061; SC0010061

OSTI ID:: 1564370

Journal Information:: Journal of Physics. D, Applied Physics, Journal Name: Journal of Physics. D, Applied Physics Journal Issue: 46 Vol. 52; ISSN 0022-3727

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United Kingdom

Language:: English

References (25)

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The PLT: A Luminosity Monitor for CMS Based on Single-Crystal Diamond Pixel Sensors Bartz, E.; Doroshenko, J.; Halyo, V. Nuclear Physics B - Proceedings Supplements, Vol. 197, Issue 1 https://doi.org/10.1016/j.nuclphysbps.2009.10.060	journal	December 2009
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Currents to Conductors Induced by a Moving Point Charge Shockley, W. Journal of Applied Physics, Vol. 9, Issue 10 https://doi.org/10.1063/1.1710367	journal	October 1938
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