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Title: The interface of SiO2/ZnS films studied by high resolution X-ray photoluminescence

Authors:
; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1564354
Grant/Contract Number:  
SC0001060
Resource Type:
Published Article
Journal Name:
Theoretical and Applied Mechanics Letters
Additional Journal Information:
Journal Name: Theoretical and Applied Mechanics Letters Journal Volume: 8 Journal Issue: 1; Journal ID: ISSN 2095-0349
Publisher:
Elsevier
Country of Publication:
Country unknown/Code not available
Language:
English

Citation Formats

Acharya, Shinjita, Trejo, Orlando, Dadlani, Anup, Torgersen, Jan, Berto, Filippo, and Prinz, Fritz. The interface of SiO2/ZnS films studied by high resolution X-ray photoluminescence. Country unknown/Code not available: N. p., 2018. Web. doi:10.1016/j.taml.2018.01.008.
Acharya, Shinjita, Trejo, Orlando, Dadlani, Anup, Torgersen, Jan, Berto, Filippo, & Prinz, Fritz. The interface of SiO2/ZnS films studied by high resolution X-ray photoluminescence. Country unknown/Code not available. doi:10.1016/j.taml.2018.01.008.
Acharya, Shinjita, Trejo, Orlando, Dadlani, Anup, Torgersen, Jan, Berto, Filippo, and Prinz, Fritz. Mon . "The interface of SiO2/ZnS films studied by high resolution X-ray photoluminescence". Country unknown/Code not available. doi:10.1016/j.taml.2018.01.008.
@article{osti_1564354,
title = {The interface of SiO2/ZnS films studied by high resolution X-ray photoluminescence},
author = {Acharya, Shinjita and Trejo, Orlando and Dadlani, Anup and Torgersen, Jan and Berto, Filippo and Prinz, Fritz},
abstractNote = {},
doi = {10.1016/j.taml.2018.01.008},
journal = {Theoretical and Applied Mechanics Letters},
number = 1,
volume = 8,
place = {Country unknown/Code not available},
year = {2018},
month = {1}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.taml.2018.01.008

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