Velocity map imaging of inelastic and elastic low energy electron scattering in organic nanoparticles

Kostko, Oleg; Jacobs, Michael I.; Xu, Bo; Wilson, Kevin R.; Ahmed, Musahid

doi:10.1063/1.5126343

Title: Velocity map imaging of inelastic and elastic low energy electron scattering in organic nanoparticles

Journal Article · 18 September 2019 · Journal of Chemical Physics

DOI: https://doi.org/10.1063/1.5126343 · OSTI ID:1564077

Kostko, Oleg ^[1]; Jacobs, Michael I. ^[2]; Xu, Bo ^[1]; Wilson, Kevin R. ^[1]; Ahmed, Musahid ^[1]

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)

Electron transport is of fundamental importance, and has application in a variety of fields. Different scattering mechanisms affect electron transport in solids. It is important to comprehensively understand these mechanisms and their scattering cross-sections to predict electron transport properties. Whereas electron transport is well understood for high kinetic energy (KE) electrons, there are inconsistencies in the low KE regime. In this study, velocity map imaging soft X-ray photoelectron spectroscopy is applied to unsupported organic nanoparticles to extract experimental values of inelastic and elastic mean free paths. The obtained data is used to calculate corresponding scattering cross-sections. The data demonstrates a decrease of the Inelastic Mean Free Path and increase of the Elastic Mean Free Path with increasing electron KE between 10-50 eV.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Chemical Sciences, Geosciences & Biosciences Division

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1564077

Journal Information:: Journal of Chemical Physics, Journal Name: Journal of Chemical Physics Journal Issue: 18 Vol. 151; ISSN 0021-9606

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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