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Title: Observation of signatures of subresolution defects in two-dimensional superconductors with a scanning SQUID

Abstract

The diamagnetic susceptibility of a superconductor is directly related to its superfluid density. Mutual inductance is a highly sensitive method for characterizing thin films, however, in traditional mutual inductance measurements, the measured response is a nontrivial average over the area of the mutual inductance coils, which are typically of millimeter size. Here we measure localized, isolated features in the diamagnetic susceptibility of Nb superconducting thin films with lithographically defined through holes, δ-doped SrTiO 3, and the two-dimensional electron system at the interface between LaAlO 3 and SrTiO 3, using scanning superconducting quantum interference device susceptometry, with spatial resolution as fine as 0.7 μm. We show that these features can be modeled as locally suppressed superfluid density, with a single parameter that characterizes the strength of each feature. In conclusion, this method provides a systematic means of finding and quantifying submicron defects in two-dimensional superconductors.

Authors:
 [1];  [1];  [2];  [3];  [3];  [4];  [1];  [2];  [1]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States)
  2. Stanford Univ., Stanford, CA (United States)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  4. SLAC National Accelerator Lab., Menlo Park, CA (United States); Univ. of Bristol, Bristol (United Kingdom)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1562882
Alternate Identifier(s):
OSTI ID: 1465615
Grant/Contract Number:  
[AC02-76SF00515]
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
[ Journal Volume: 98; Journal Issue: 6]; Journal ID: ISSN 2469-9950
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Noad, Hilary, Watson, Christopher A., Inoue, Hisashi, Kim, Minu, Sato, Hiroki K., Bell, Christopher, Hwang, Harold Y., Kirtley, John R., and Moler, Kathryn A. Observation of signatures of subresolution defects in two-dimensional superconductors with a scanning SQUID. United States: N. p., 2018. Web. doi:10.1103/physrevb.98.064510.
Noad, Hilary, Watson, Christopher A., Inoue, Hisashi, Kim, Minu, Sato, Hiroki K., Bell, Christopher, Hwang, Harold Y., Kirtley, John R., & Moler, Kathryn A. Observation of signatures of subresolution defects in two-dimensional superconductors with a scanning SQUID. United States. doi:10.1103/physrevb.98.064510.
Noad, Hilary, Watson, Christopher A., Inoue, Hisashi, Kim, Minu, Sato, Hiroki K., Bell, Christopher, Hwang, Harold Y., Kirtley, John R., and Moler, Kathryn A. Tue . "Observation of signatures of subresolution defects in two-dimensional superconductors with a scanning SQUID". United States. doi:10.1103/physrevb.98.064510. https://www.osti.gov/servlets/purl/1562882.
@article{osti_1562882,
title = {Observation of signatures of subresolution defects in two-dimensional superconductors with a scanning SQUID},
author = {Noad, Hilary and Watson, Christopher A. and Inoue, Hisashi and Kim, Minu and Sato, Hiroki K. and Bell, Christopher and Hwang, Harold Y. and Kirtley, John R. and Moler, Kathryn A.},
abstractNote = {The diamagnetic susceptibility of a superconductor is directly related to its superfluid density. Mutual inductance is a highly sensitive method for characterizing thin films, however, in traditional mutual inductance measurements, the measured response is a nontrivial average over the area of the mutual inductance coils, which are typically of millimeter size. Here we measure localized, isolated features in the diamagnetic susceptibility of Nb superconducting thin films with lithographically defined through holes, δ-doped SrTiO3, and the two-dimensional electron system at the interface between LaAlO3 and SrTiO3, using scanning superconducting quantum interference device susceptometry, with spatial resolution as fine as 0.7 μm. We show that these features can be modeled as locally suppressed superfluid density, with a single parameter that characterizes the strength of each feature. In conclusion, this method provides a systematic means of finding and quantifying submicron defects in two-dimensional superconductors.},
doi = {10.1103/physrevb.98.064510},
journal = {Physical Review B},
number = [6],
volume = [98],
place = {United States},
year = {2018},
month = {8}
}

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Figures / Tables:

FIG. 1 FIG. 1: Assumed geometry. A superconducting film of thickness $d$ and infinite extent in the $x$ and $y$ directions is centered on the plane $z$ = 0. The susceptometer field coil and pickup loop are modeled as co-planar, infinitely thin circular loops of radius a and b respectively, oriented parallelmore » to the thin film in the plane $z$ = $z$0. A point defect is at $x$ = $x$0, $y$ = 0, $z$ = 0.« less

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