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Title: Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy

Abstract

Control of local lattice perturbations near optically-active defects in quantum materials is a key step to harnessing the potential of solid-state qubits for quantum information science and nanoscale sensing. We report the development of a stroboscopic Scanning X-ray Diffraction Microscopy (s-SXDM) approach for real-space imaging of dynamic strain used in correlation with microscopic photoluminescence measurements. We demonstrate this technique in the emergent quantum material 4H-SiC, which hosts long-lifetime room temperature vacancy spin defects. Using nano-focused X-ray photon pulses synchronized to a surface acoustic wave launcher, we achieve an effective time resolution of ~100 ps at a 25 nm spatial resolution to map micro-radian dynamic lattice curvatures. The acoustically induced lattice distortions near an engineered scattering structure are correlated with enhanced photoluminescence responses of optically-active SiC quantum defects driven by local piezoelectric effects. These results demonstrate a unique route for directly imaging local strain in nanomechanical structures and quantifying dynamic structure-function relationships in quantum materials under realistic operating conditions.

Authors:
 [1]; ORCiD logo [2];  [3]; ORCiD logo [4]; ORCiD logo [5]
  1. Univ. of Chicago, IL (United States). Pritzker School of Molecular Engineering, and Dept. of Physics
  2. Univ. of Chicago, IL (United States). Pritzker School of Molecular Engineering; Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division, and Center for Molecular Engineering
  3. Univ. of Chicago, IL (United States). Pritzker School of Molecular Engineering; Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division, and Center for Molecular Engineering ; Tohoku Univ., Sendai (Japan). WPI-Advanced Inst. for Materials Research
  4. Univ. of Chicago, IL (United States). Pritzker School of Molecular Engineering, and Dept. of Physics; Univ. of Chicago, IL (United States). Pritzker School of Molecular Engineering; Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division, and Center for Molecular Engineering
  5. Argonne National Lab. (ANL), Argonne, IL (United States). Center for Nanoscale Materials
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
Air Force Research Laboratory (AFRL); US Air Force Office of Scientific Research (AFOSR); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
OSTI Identifier:
1557252
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Nature Communications
Additional Journal Information:
Journal Volume: 10; Journal Issue: 1; Journal ID: ISSN 2041-1723
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Whiteley, S. J., Heremans, F. J., Wolfowicz, G., Awschalom, D. D., and Holt, M. V. Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy. United States: N. p., 2019. Web. doi:10.1038/s41467-019-11365-9.
Whiteley, S. J., Heremans, F. J., Wolfowicz, G., Awschalom, D. D., & Holt, M. V. Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy. United States. doi:10.1038/s41467-019-11365-9.
Whiteley, S. J., Heremans, F. J., Wolfowicz, G., Awschalom, D. D., and Holt, M. V. Mon . "Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy". United States. doi:10.1038/s41467-019-11365-9. https://www.osti.gov/servlets/purl/1557252.
@article{osti_1557252,
title = {Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy},
author = {Whiteley, S. J. and Heremans, F. J. and Wolfowicz, G. and Awschalom, D. D. and Holt, M. V.},
abstractNote = {Control of local lattice perturbations near optically-active defects in quantum materials is a key step to harnessing the potential of solid-state qubits for quantum information science and nanoscale sensing. We report the development of a stroboscopic Scanning X-ray Diffraction Microscopy (s-SXDM) approach for real-space imaging of dynamic strain used in correlation with microscopic photoluminescence measurements. We demonstrate this technique in the emergent quantum material 4H-SiC, which hosts long-lifetime room temperature vacancy spin defects. Using nano-focused X-ray photon pulses synchronized to a surface acoustic wave launcher, we achieve an effective time resolution of ~100 ps at a 25 nm spatial resolution to map micro-radian dynamic lattice curvatures. The acoustically induced lattice distortions near an engineered scattering structure are correlated with enhanced photoluminescence responses of optically-active SiC quantum defects driven by local piezoelectric effects. These results demonstrate a unique route for directly imaging local strain in nanomechanical structures and quantifying dynamic structure-function relationships in quantum materials under realistic operating conditions.},
doi = {10.1038/s41467-019-11365-9},
journal = {Nature Communications},
number = 1,
volume = 10,
place = {United States},
year = {2019},
month = {7}
}

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