Charge transfer excitations in VUV and soft X-ray resonant scattering spectroscopies

Augustin, Edwin; He, Haowei; Miao, Lin; Chuang, Yi-De; Hussain, Zahid; Wray, L. Andrew

doi:10.1016/j.elspec.2016.12.004

Title: Charge transfer excitations in VUV and soft X-ray resonant scattering spectroscopies

Full Record
Other Related Research

Authors:: Augustin, Edwin; He, Haowei; Miao, Lin; Chuang, Yi-De; Hussain, Zahid; Wray, L. Andrew

Publication Date:: 2017-10-01

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1550639

Grant/Contract Number:: AC02-05CH11231

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Journal of Electron Spectroscopy and Related Phenomena

Additional Journal Information:: Journal Name: Journal of Electron Spectroscopy and Related Phenomena Journal Volume: 220 Journal Issue: C; Journal ID: ISSN 0368-2048

Publisher:: Elsevier

Country of Publication:: Netherlands

Language:: English

Citation Formats


                    Augustin, Edwin, He, Haowei, Miao, Lin, Chuang, Yi-De, Hussain, Zahid, and Wray, L. Andrew. Charge transfer excitations in VUV and soft X-ray resonant scattering spectroscopies.  Netherlands: N. p., 2017. 
Web.  doi:10.1016/j.elspec.2016.12.004.

Copy to clipboard


                    Augustin, Edwin, He, Haowei, Miao, Lin, Chuang, Yi-De, Hussain, Zahid, & Wray, L. Andrew. Charge transfer excitations in VUV and soft X-ray resonant scattering spectroscopies.  Netherlands.  https://doi.org/10.1016/j.elspec.2016.12.004

Copy to clipboard


                    Augustin, Edwin, He, Haowei, Miao, Lin, Chuang, Yi-De, Hussain, Zahid, and Wray, L. Andrew. Sun .  
"Charge transfer excitations in VUV and soft X-ray resonant scattering spectroscopies".  Netherlands.  https://doi.org/10.1016/j.elspec.2016.12.004.

Copy to clipboard


                    
@article{osti_1550639,

  title        = {Charge transfer excitations in VUV and soft X-ray resonant scattering spectroscopies},

  author       = {Augustin, Edwin and He, Haowei and Miao, Lin and Chuang, Yi-De and Hussain, Zahid and Wray, L. Andrew},

  abstractNote = {},

  doi          = {10.1016/j.elspec.2016.12.004},

  journal      = {Journal of Electron Spectroscopy and Related Phenomena},

  number       = C,

  volume       = 220,

  place        = {Netherlands},

  year         = {2017},

  month        = {10}

}

Copy to clipboard

Journal Article:

Free Publicly Available Full Text

Accepted Manuscript (Publisher)

Publisher's Version of Record
https://doi.org/10.1016/j.elspec.2016.12.004

Other availability

Search WorldCat to find libraries that may hold this journal

Citation Metrics:

Cited by: 6 works

Citation information provided by
Web of Science

Save / Share:

Export Metadata

Save to My Library

Similar Records in DOE PAGES and OSTI.GOV collections:

X-ray resonant Raman scattering in NiO: Resonant enhancement of the charge-transfer excitations

Journal Article Kao, C ; Caliebe, W A ; Hastings, J B ; ... - Physical Review, B: Condensed Matter

An energy loss feature with energy transfer close to the anion-to-cation charge-transfer energy of NiO is observed in the inelastic-x-ray-scattering spectrum as the incident x-ray energy is tuned through the Ni {ital K} absorption edge of NiO. The inelastic-scattering cross section shows large resonant enhancement and strong incident energy dependence. These observations are interpreted using a configuration-interaction cluster model of NiO. {copyright} {ital 1996 The American Physical Society.}
https://doi.org/10.1103/PhysRevB.54.16361
Soft x-ray fluorescence spectroscopy excited by synchrotron radiation: Inelastic and resonant scattering near threshold

Conference Ederer, D L ; Diebold, U ; Asfaw, A ; ...

X-rays have been used as a scientific tool for almost 100 years. The presence of x-ray fluorescence has been detected almost since the day x-rays were discovered. This talk will be a report on the valence band emission intensity as a function of the energy of the photon excitation in the 100-500 eV energy band. Emission measurements from silicon and several wide band gap insulators will be presented.
Generation of coherent vuv (vacuum ultraviolet) and soft x-rays. Semiannual report No. 1, 1 Aug 1975--31 Jan 1976. [Excitation of strongly forbidden levels by thermal-velocity charge exchange collisions]

Technical Report Harris, S E ; Young, J F

During this reporting period three projects have been active. The first project is a study of three frequency summing in inert gases for the generation of short wavelength radiation. The authors have studied both helium and neon systems; they have concluded that the helium experiment is impractical because of the technical difficulties involved in generating the required wavelength. These difficulties are much less severe for the neon system, because of a natural near-coincidence of a neon non-allowed transition and the 16th harmonic of the Nd:YAG laser frequency. The second project resulted in the first observation of a laser induced inelasticmore »« less
Characterization of Charge Transfer Excitations in Hexacyanomanganate(III) with Mn K-Edge Resonant Inelastic X-Ray Scattering

Journal Article Meyer, D. A. ; Zhang, X. ; Bergmann, U. ; ... - J. Chem. Phys 132:134592,2010
Charge-transfer and Mott-Hubbard Excitations in FeBo{sub 3} : Fe K-edge resonant Inelastic x-ray scattering study.

Journal Article Kim, J ; Shvydko, Y - Physical Review. B, Condensed Matter and Materials Physics

Momentum-resolved resonant inelastic x-ray scattering (RIXS) spectroscopy has been carried out successfully at the Fe K-edge for the first time. The RIXS spectra of a FeBO{sub 3} single crystal reveal a wealth of information on {approx} 1-10 eV electronic excitations. The IXS signal resonates when the incident photon energy approaches the pre-edge (1s{sup -}-3d) and the main-edge (1s{sup -}-4p) of the Fe K-edge absorption spectrum. The RIXS spectra measured at the pre-edge and the main-edge show quantitatively different dependences on the incident photon energy, momentum transfer, photon polarization, and temperature. We present a multielectron analysis of the Mott-Hubbard (MH) andmore »« less
https://doi.org/10.1103/PhysRevB.83.235109

Similar Records