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Title: Operando X-ray photoelectron spectroscopic investigations of the electrochemical double layer at Ir/KOH(aq) interfaces

Authors:
; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1550564
Grant/Contract Number:  
[SC0004993; AC02-05CH11231]
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Electron Spectroscopy and Related Phenomena
Additional Journal Information:
[Journal Name: Journal of Electron Spectroscopy and Related Phenomena Journal Volume: 221 Journal Issue: C]; Journal ID: ISSN 0368-2048
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Lichterman, Michael F., Richter, Matthias H., Brunschwig, Bruce S., Lewis, Nathan S., and Lewerenz, Hans-Joachim. Operando X-ray photoelectron spectroscopic investigations of the electrochemical double layer at Ir/KOH(aq) interfaces. Netherlands: N. p., 2017. Web. doi:10.1016/j.elspec.2017.03.011.
Lichterman, Michael F., Richter, Matthias H., Brunschwig, Bruce S., Lewis, Nathan S., & Lewerenz, Hans-Joachim. Operando X-ray photoelectron spectroscopic investigations of the electrochemical double layer at Ir/KOH(aq) interfaces. Netherlands. doi:10.1016/j.elspec.2017.03.011.
Lichterman, Michael F., Richter, Matthias H., Brunschwig, Bruce S., Lewis, Nathan S., and Lewerenz, Hans-Joachim. Wed . "Operando X-ray photoelectron spectroscopic investigations of the electrochemical double layer at Ir/KOH(aq) interfaces". Netherlands. doi:10.1016/j.elspec.2017.03.011.
@article{osti_1550564,
title = {Operando X-ray photoelectron spectroscopic investigations of the electrochemical double layer at Ir/KOH(aq) interfaces},
author = {Lichterman, Michael F. and Richter, Matthias H. and Brunschwig, Bruce S. and Lewis, Nathan S. and Lewerenz, Hans-Joachim},
abstractNote = {},
doi = {10.1016/j.elspec.2017.03.011},
journal = {Journal of Electron Spectroscopy and Related Phenomena},
number = [C],
volume = [221],
place = {Netherlands},
year = {2017},
month = {11}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.elspec.2017.03.011

Citation Metrics:
Cited by: 2 works
Citation information provided by
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