High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1550416
- Grant/Contract Number:
- DE FG02-03ER15476
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Ultramicroscopy
- Additional Journal Information:
- Journal Name: Ultramicroscopy Journal Volume: 182 Journal Issue: C; Journal ID: ISSN 0304-3991
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
House, Stephen D., Chen, Yuxiang, Jin, Rongchao, and Yang, Judith C. High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM. Netherlands: N. p., 2017.
Web. doi:10.1016/j.ultramic.2017.07.004.
House, Stephen D., Chen, Yuxiang, Jin, Rongchao, & Yang, Judith C. High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM. Netherlands. https://doi.org/10.1016/j.ultramic.2017.07.004
House, Stephen D., Chen, Yuxiang, Jin, Rongchao, and Yang, Judith C. Wed .
"High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM". Netherlands. https://doi.org/10.1016/j.ultramic.2017.07.004.
@article{osti_1550416,
title = {High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM},
author = {House, Stephen D. and Chen, Yuxiang and Jin, Rongchao and Yang, Judith C.},
abstractNote = {},
doi = {10.1016/j.ultramic.2017.07.004},
journal = {Ultramicroscopy},
number = C,
volume = 182,
place = {Netherlands},
year = {2017},
month = {11}
}
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.ultramic.2017.07.004
https://doi.org/10.1016/j.ultramic.2017.07.004
Other availability
Cited by: 4 works
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