Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE Office of Nuclear Energy (NE)
- OSTI Identifier:
- 1550270
- Grant/Contract Number:
- DEFG-07-14891; FG02-07ER46453; FG02-07ER46471
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Thin Solid Films
- Additional Journal Information:
- Journal Name: Thin Solid Films Journal Volume: 636 Journal Issue: C; Journal ID: ISSN 0040-6090
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
Elbakhshwan, Mohamed S., and Heuser, Brent J. Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates. Netherlands: N. p., 2017.
Web. doi:10.1016/j.tsf.2017.07.020.
Elbakhshwan, Mohamed S., & Heuser, Brent J. Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates. Netherlands. https://doi.org/10.1016/j.tsf.2017.07.020
Elbakhshwan, Mohamed S., and Heuser, Brent J. Tue .
"Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates". Netherlands. https://doi.org/10.1016/j.tsf.2017.07.020.
@article{osti_1550270,
title = {Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates},
author = {Elbakhshwan, Mohamed S. and Heuser, Brent J.},
abstractNote = {},
doi = {10.1016/j.tsf.2017.07.020},
journal = {Thin Solid Films},
number = C,
volume = 636,
place = {Netherlands},
year = {Tue Aug 01 00:00:00 EDT 2017},
month = {Tue Aug 01 00:00:00 EDT 2017}
}
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.tsf.2017.07.020
https://doi.org/10.1016/j.tsf.2017.07.020
Other availability
Cited by: 8 works
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