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Title: Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates

Authors:
;
Publication Date:
Sponsoring Org.:
USDOE Office of Nuclear Energy (NE)
OSTI Identifier:
1550270
Grant/Contract Number:  
DEFG-07-14891; FG02-07ER46453; FG02-07ER46471
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Thin Solid Films
Additional Journal Information:
Journal Name: Thin Solid Films Journal Volume: 636 Journal Issue: C; Journal ID: ISSN 0040-6090
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Elbakhshwan, Mohamed S., and Heuser, Brent J. Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates. Netherlands: N. p., 2017. Web. doi:10.1016/j.tsf.2017.07.020.
Elbakhshwan, Mohamed S., & Heuser, Brent J. Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates. Netherlands. https://doi.org/10.1016/j.tsf.2017.07.020
Elbakhshwan, Mohamed S., and Heuser, Brent J. Tue . "Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates". Netherlands. https://doi.org/10.1016/j.tsf.2017.07.020.
@article{osti_1550270,
title = {Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates},
author = {Elbakhshwan, Mohamed S. and Heuser, Brent J.},
abstractNote = {},
doi = {10.1016/j.tsf.2017.07.020},
journal = {Thin Solid Films},
number = C,
volume = 636,
place = {Netherlands},
year = {Tue Aug 01 00:00:00 EDT 2017},
month = {Tue Aug 01 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.tsf.2017.07.020

Citation Metrics:
Cited by: 8 works
Citation information provided by
Web of Science

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