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Title: Improving microstructural quantification in FIB/SEM nanotomography

Authors:
; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1549711
Grant/Contract Number:  
DEFE0009084
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Name: Ultramicroscopy Journal Volume: 184 Journal Issue: PA; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Taillon, Joshua A., Pellegrinelli, Christopher, Huang, Yi-Lin, Wachsman, Eric D., and Salamanca-Riba, Lourdes G. Improving microstructural quantification in FIB/SEM nanotomography. Netherlands: N. p., 2018. Web. doi:10.1016/j.ultramic.2017.07.017.
Taillon, Joshua A., Pellegrinelli, Christopher, Huang, Yi-Lin, Wachsman, Eric D., & Salamanca-Riba, Lourdes G. Improving microstructural quantification in FIB/SEM nanotomography. Netherlands. doi:10.1016/j.ultramic.2017.07.017.
Taillon, Joshua A., Pellegrinelli, Christopher, Huang, Yi-Lin, Wachsman, Eric D., and Salamanca-Riba, Lourdes G. Mon . "Improving microstructural quantification in FIB/SEM nanotomography". Netherlands. doi:10.1016/j.ultramic.2017.07.017.
@article{osti_1549711,
title = {Improving microstructural quantification in FIB/SEM nanotomography},
author = {Taillon, Joshua A. and Pellegrinelli, Christopher and Huang, Yi-Lin and Wachsman, Eric D. and Salamanca-Riba, Lourdes G.},
abstractNote = {},
doi = {10.1016/j.ultramic.2017.07.017},
journal = {Ultramicroscopy},
number = PA,
volume = 184,
place = {Netherlands},
year = {2018},
month = {1}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.ultramic.2017.07.017

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Cited by: 3 works
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