Improving microstructural quantification in FIB/SEM nanotomography
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1549711
- Grant/Contract Number:
- DGE1322106; DEFE0009084
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Ultramicroscopy
- Additional Journal Information:
- Journal Name: Ultramicroscopy Journal Volume: 184 Journal Issue: PA; Journal ID: ISSN 0304-3991
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
Taillon, Joshua A., Pellegrinelli, Christopher, Huang, Yi-Lin, Wachsman, Eric D., and Salamanca-Riba, Lourdes G. Improving microstructural quantification in FIB/SEM nanotomography. Netherlands: N. p., 2018.
Web. doi:10.1016/j.ultramic.2017.07.017.
Taillon, Joshua A., Pellegrinelli, Christopher, Huang, Yi-Lin, Wachsman, Eric D., & Salamanca-Riba, Lourdes G. Improving microstructural quantification in FIB/SEM nanotomography. Netherlands. https://doi.org/10.1016/j.ultramic.2017.07.017
Taillon, Joshua A., Pellegrinelli, Christopher, Huang, Yi-Lin, Wachsman, Eric D., and Salamanca-Riba, Lourdes G. Mon .
"Improving microstructural quantification in FIB/SEM nanotomography". Netherlands. https://doi.org/10.1016/j.ultramic.2017.07.017.
@article{osti_1549711,
title = {Improving microstructural quantification in FIB/SEM nanotomography},
author = {Taillon, Joshua A. and Pellegrinelli, Christopher and Huang, Yi-Lin and Wachsman, Eric D. and Salamanca-Riba, Lourdes G.},
abstractNote = {},
doi = {10.1016/j.ultramic.2017.07.017},
journal = {Ultramicroscopy},
number = PA,
volume = 184,
place = {Netherlands},
year = {Mon Jan 01 00:00:00 EST 2018},
month = {Mon Jan 01 00:00:00 EST 2018}
}
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https://doi.org/10.1016/j.ultramic.2017.07.017
https://doi.org/10.1016/j.ultramic.2017.07.017
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Cited by: 24 works
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