Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses

doi:10.1016/j.ultramic.2017.10.007

Title: Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses

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Authors:: Baik, Sung-Il; Isheim, Dieter; Seidman, David N.

Publication Date:: 2018-01-01

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1549302

Grant/Contract Number:: AC06-76RLO 1830

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Ultramicroscopy

Additional Journal Information:: Journal Name: Ultramicroscopy Journal Volume: 184 Journal Issue: PA; Journal ID: ISSN 0304-3991

Publisher:: Elsevier

Country of Publication:: Netherlands

Language:: English

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                    Baik, Sung-Il, Isheim, Dieter, and Seidman, David N. Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses.  Netherlands: N. p., 2018. 
        Web.  doi:10.1016/j.ultramic.2017.10.007.

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                    Baik, Sung-Il, Isheim, Dieter, & Seidman, David N. Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses.  Netherlands.  doi:10.1016/j.ultramic.2017.10.007.

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                    Baik, Sung-Il, Isheim, Dieter, and Seidman, David N. Mon .  
        "Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses".  Netherlands.  doi:10.1016/j.ultramic.2017.10.007.

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@article{osti_1549302,

  title        = {Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses},

  author       = {Baik, Sung-Il and Isheim, Dieter and Seidman, David N.},

  abstractNote = {},

  doi          = {10.1016/j.ultramic.2017.10.007},

  journal      = {Ultramicroscopy},

  number       = PA,

  volume       = 184,

  place        = {Netherlands},

  year         = {2018},

  month        = {1}

}

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DOI: 10.1016/j.ultramic.2017.10.007

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