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Title: Sampling limits for electron tomography with sparsity-exploiting reconstructions

Authors:
; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1548925
Grant/Contract Number:  
SC0011385; FG02-11ER16210
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Name: Ultramicroscopy Journal Volume: 186 Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Jiang, Yi, Padgett, Elliot, Hovden, Robert, and Muller, David A. Sampling limits for electron tomography with sparsity-exploiting reconstructions. Netherlands: N. p., 2018. Web. doi:10.1016/j.ultramic.2017.12.010.
Jiang, Yi, Padgett, Elliot, Hovden, Robert, & Muller, David A. Sampling limits for electron tomography with sparsity-exploiting reconstructions. Netherlands. doi:10.1016/j.ultramic.2017.12.010.
Jiang, Yi, Padgett, Elliot, Hovden, Robert, and Muller, David A. Thu . "Sampling limits for electron tomography with sparsity-exploiting reconstructions". Netherlands. doi:10.1016/j.ultramic.2017.12.010.
@article{osti_1548925,
title = {Sampling limits for electron tomography with sparsity-exploiting reconstructions},
author = {Jiang, Yi and Padgett, Elliot and Hovden, Robert and Muller, David A.},
abstractNote = {},
doi = {10.1016/j.ultramic.2017.12.010},
journal = {Ultramicroscopy},
number = C,
volume = 186,
place = {Netherlands},
year = {2018},
month = {3}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.ultramic.2017.12.010

Citation Metrics:
Cited by: 2 works
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