Sampling limits for electron tomography with sparsity-exploiting reconstructions

doi:10.1016/j.ultramic.2017.12.010

Title: Sampling limits for electron tomography with sparsity-exploiting reconstructions

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Authors:: Jiang, Yi; Padgett, Elliot; Hovden, Robert; Muller, David A.

Publication Date:: 2018-03-01

Sponsoring Org.:: USDOE

OSTI Identifier:: 1548925

Grant/Contract Number:: SC0011385; FG02-11ER16210

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Ultramicroscopy

Additional Journal Information:: Journal Name: Ultramicroscopy Journal Volume: 186 Journal Issue: C; Journal ID: ISSN 0304-3991

Publisher:: Elsevier

Country of Publication:: Netherlands

Language:: English

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                    Jiang, Yi, Padgett, Elliot, Hovden, Robert, and Muller, David A. Sampling limits for electron tomography with sparsity-exploiting reconstructions.  Netherlands: N. p., 2018. 
        Web.  doi:10.1016/j.ultramic.2017.12.010.

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                    Jiang, Yi, Padgett, Elliot, Hovden, Robert, & Muller, David A. Sampling limits for electron tomography with sparsity-exploiting reconstructions.  Netherlands.  doi:10.1016/j.ultramic.2017.12.010.

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                    Jiang, Yi, Padgett, Elliot, Hovden, Robert, and Muller, David A. Thu .  
        "Sampling limits for electron tomography with sparsity-exploiting reconstructions".  Netherlands.  doi:10.1016/j.ultramic.2017.12.010.

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@article{osti_1548925,

  title        = {Sampling limits for electron tomography with sparsity-exploiting reconstructions},

  author       = {Jiang, Yi and Padgett, Elliot and Hovden, Robert and Muller, David A.},

  abstractNote = {},

  doi          = {10.1016/j.ultramic.2017.12.010},

  journal      = {Ultramicroscopy},

  number       = C,

  volume       = 186,

  place        = {Netherlands},

  year         = {2018},

  month        = {3}

}

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DOI: 10.1016/j.ultramic.2017.12.010

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