Sampling limits for electron tomography with sparsity-exploiting reconstructions
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1548925
- Grant/Contract Number:
- SC0011385; FG02-11ER16210
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Ultramicroscopy
- Additional Journal Information:
- Journal Name: Ultramicroscopy Journal Volume: 186 Journal Issue: C; Journal ID: ISSN 0304-3991
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
Jiang, Yi, Padgett, Elliot, Hovden, Robert, and Muller, David A. Sampling limits for electron tomography with sparsity-exploiting reconstructions. Netherlands: N. p., 2018.
Web. doi:10.1016/j.ultramic.2017.12.010.
Jiang, Yi, Padgett, Elliot, Hovden, Robert, & Muller, David A. Sampling limits for electron tomography with sparsity-exploiting reconstructions. Netherlands. doi:10.1016/j.ultramic.2017.12.010.
Jiang, Yi, Padgett, Elliot, Hovden, Robert, and Muller, David A. Thu .
"Sampling limits for electron tomography with sparsity-exploiting reconstructions". Netherlands. doi:10.1016/j.ultramic.2017.12.010.
@article{osti_1548925,
title = {Sampling limits for electron tomography with sparsity-exploiting reconstructions},
author = {Jiang, Yi and Padgett, Elliot and Hovden, Robert and Muller, David A.},
abstractNote = {},
doi = {10.1016/j.ultramic.2017.12.010},
journal = {Ultramicroscopy},
number = C,
volume = 186,
place = {Netherlands},
year = {2018},
month = {3}
}
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.ultramic.2017.12.010
DOI: 10.1016/j.ultramic.2017.12.010
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Cited by: 2 works
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